ZC

Zhong-Wei Chen

AB Asml Netherlands B.V.: 28 patents #133 of 3,192Top 5%
HM Hermes Microvision: 16 patents #10 of 68Top 15%
KI Kla Instruments: 3 patents #10 of 99Top 15%
HO Honeywell: 2 patents #4,946 of 14,447Top 35%
VE Verizon: 1 patents #3,381 of 6,226Top 55%
📍 San Jose, CA: #869 of 32,062 inventorsTop 3%
🗺 California: #7,167 of 386,348 inventorsTop 2%
Overall (All Time): #48,039 of 4,157,543Top 2%
53
Patents All Time

Issued Patents All Time

Showing 51–53 of 53 patents

Patent #TitleCo-InventorsDate
5717204 Inspecting optical masks with electron beam microscopy Dan Meisburger, Alan D. Brodie, Jack Jau 1998-02-10
5665968 Inspecting optical masks with electron beam microscopy Dan Meisburger, Alan D. Brodie, Jack Jau, Brian J. Grenon 1997-09-09
5578821 Electron beam inspection system and method Dan Meisberger, Alan D. Brodie, Anil Desai, Dennis G. Emge, Richard R. Simmons +7 more 1996-11-26