Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9208553 | Image synchronization of scanning wafer inspection system | Kai Cao, Zhiqin Wang, Jamie M. Sullivan, Wenjian Cai, Henrik Nielsen | 2015-12-08 |
| 8995746 | Image synchronization of scanning wafer inspection system | Kai Cao, Zhiqin Wang, Jamie M. Sullivan, Wenjian Cai, Henrik Nielsen | 2015-03-31 |
| 5578821 | Electron beam inspection system and method | Dan Meisberger, Alan D. Brodie, Anil Desai, Zhong-Wei Chen, Richard R. Simmons +7 more | 1996-11-26 |
| 5502306 | Electron beam inspection system and method | Dan Meisburger, Alan D. Brodie, Curt H. Chadwick, Anil Desai, Hans-Peter Dohse +28 more | 1996-03-26 |