Issued Patents All Time
Showing 1–12 of 12 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11835652 | LiDAR system with cylindrical lenses | Lu Gao | 2023-12-05 |
| 11294035 | LiDAR system with cylindrical lenses | Lu Gao | 2022-04-05 |
| 11061116 | Lidar system with image size compensation mechanism | Lu Gao | 2021-07-13 |
| 10060884 | Interleaved acousto-optical device scanning for suppression of optical crosstalk | Jamie M. Sullivan, Yevgeniy Churin, Ralph Johnson, Meier Brender, Mark Wang +2 more | 2018-08-28 |
| 9970883 | Multi-spot scanning collection optics | Jamie M. Sullivan, Ralph Johnson, Evegeny Churin, Yong-Mo Moon | 2018-05-15 |
| 9864173 | Systems and methods for run-time alignment of a spot scanning wafer inspection system | Jamie M. Sullivan, Kai Cao | 2018-01-09 |
| 9645093 | System and method for apodization in a semiconductor device inspection system | Jamie M. Sullivan, Gary Janik, Steve Cui, Rex Runyon, Dieter Wilk +8 more | 2017-05-09 |
| 9546962 | Multi-spot scanning collection optics | Jamie M. Sullivan, Ralph Johnson, Evegeny Churin, Yong-Mo Moon | 2017-01-17 |
| 9395340 | Interleaved acousto-optical device scanning for suppression of optical crosstalk | Jamie M. Sullivan, Yevgeniy Churin, Ralph Johnson, Meier Brender, Mark Wang +2 more | 2016-07-19 |
| 9208553 | Image synchronization of scanning wafer inspection system | Kai Cao, Dennis G. Emge, Zhiqin Wang, Jamie M. Sullivan, Henrik Nielsen | 2015-12-08 |
| 9176069 | System and method for apodization in a semiconductor device inspection system | Jamie M. Sullivan, Gary Janik, Steve Cui, Rex Runyon, Dieter Wilk +8 more | 2015-11-03 |
| 8995746 | Image synchronization of scanning wafer inspection system | Kai Cao, Dennis G. Emge, Zhiqin Wang, Jamie M. Sullivan, Henrik Nielsen | 2015-03-31 |