Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10060884 | Interleaved acousto-optical device scanning for suppression of optical crosstalk | Jamie M. Sullivan, Wenjian Cai, Yevgeniy Churin, Meier Brender, Mark Wang +2 more | 2018-08-28 |
| 9970883 | Multi-spot scanning collection optics | Jamie M. Sullivan, Evegeny Churin, Wenjian Cai, Yong-Mo Moon | 2018-05-15 |
| 9546962 | Multi-spot scanning collection optics | Jamie M. Sullivan, Evegeny Churin, Wenjian Cai, Yong-Mo Moon | 2017-01-17 |
| 9395340 | Interleaved acousto-optical device scanning for suppression of optical crosstalk | Jamie M. Sullivan, Wenjian Cai, Yevgeniy Churin, Meier Brender, Mark Wang +2 more | 2016-07-19 |
| 6775051 | Systems and methods for scanning a beam of light across a specimen | Jamie M. Sullivan, John Gibson, Mingguang Li, Eric Vella | 2004-08-10 |
| 6686995 | Two-dimensional UV compatible programmable spatial filter | Dieter Wilk, Anlun Tang, Eric Vella, Rex Runyon, Jamie M. Sullivan | 2004-02-03 |
| 5604585 | Particle detection system employing a subsystem for collecting scattered light from the particles | Keith Wells, Lee K. Galbraith | 1997-02-18 |
| 5502306 | Electron beam inspection system and method | Dan Meisburger, Alan D. Brodie, Curt H. Chadwick, Anil Desai, Hans-Peter Dohse +28 more | 1996-03-26 |
| 5355212 | Process for inspecting patterned wafers | Keith Wells, Hung Nguyen, Brian C. Leslie | 1994-10-11 |