Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10088345 | Haze and defect distribution and aperture configuration in surface metrology inspectors | Chuanyong Huang, Raymond Chu, Gordana Neskovic, Christian Wolters, Tim Mahatdejkul | 2018-10-02 |
| 9645093 | System and method for apodization in a semiconductor device inspection system | Jamie M. Sullivan, Gary Janik, Steve Cui, Rex Runyon, Steve Short +8 more | 2017-05-09 |
| 9176069 | System and method for apodization in a semiconductor device inspection system | Jamie M. Sullivan, Gary Janik, Steve Cui, Rex Runyon, Steve Short +8 more | 2015-11-03 |
| 6686994 | UV compatible programmable spatial filter | Anlun Tang, Eric Vella, Rex Runyon, Jamie M. Sullivan | 2004-02-03 |
| 6686995 | Two-dimensional UV compatible programmable spatial filter | Anlun Tang, Eric Vella, Rex Runyon, Jamie M. Sullivan, Ralph Johnson | 2004-02-03 |