Issued Patents All Time
Showing 25 most recent of 50 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10332604 | Configuration parameter management for non-volatile data storage | James G. Peterson, Jea Hyun | 2019-06-25 |
| 10268396 | Systems and methods for managing storage endurance | — | 2019-04-23 |
| 10096478 | System and method for rejuvenating an imaging sensor degraded by exposure to extreme ultraviolet or deep ultraviolet light | Gildardo Delgado | 2018-10-09 |
| 9852799 | Configuration parameter management for non-volatile data storage | James G. Peterson, Jea Hyun | 2017-12-26 |
| 9766819 | Systems and methods for managing storage endurance | — | 2017-09-19 |
| 9645093 | System and method for apodization in a semiconductor device inspection system | Jamie M. Sullivan, Steve Cui, Rex Runyon, Dieter Wilk, Steve Short +8 more | 2017-05-09 |
| 9176069 | System and method for apodization in a semiconductor device inspection system | Jamie M. Sullivan, Steve Cui, Rex Runyon, Dieter Wilk, Steve Short +8 more | 2015-11-03 |
| 8257496 | Crucible weight measurement system for controlling feedstock introduction in Czochralski crystal growth | David L. Bender, Roy P. Crawford, David E. Smith | 2012-09-04 |
| 7903260 | Scatterometry metrology using inelastic scattering | — | 2011-03-08 |
| 7764376 | Systems and methods for measurement of a specimen with vacuum ultraviolet light | John Fielden, Shing Lee | 2010-07-27 |
| 7688454 | Scatterometry metrology using inelastic scattering | — | 2010-03-30 |
| 7623239 | Systems and methods for measurement of a specimen with vacuum ultraviolet light | John Fielden, Shing Lee | 2009-11-24 |
| 7606677 | Dynamic measurement control | Eric Bouche, John Fielden | 2009-10-20 |
| 7564552 | Systems and methods for measurement of a specimen with vacuum ultraviolet light | John Fielden, Shing Lee | 2009-07-21 |
| 7521946 | Electrical measurements on semiconductors using corona and microwave techniques | — | 2009-04-21 |
| 7495217 | Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysis | Ying Gao | 2009-02-24 |
| 7433056 | Scatterometry metrology using inelastic scattering | — | 2008-10-07 |
| 7427757 | Large collection angle x-ray monochromators for electron probe microanalysis | Jeffrey Allen Moore | 2008-09-23 |
| 7369235 | Method and system for measuring deep trenches in silicon | John Fielden | 2008-05-06 |
| 7369233 | Optical system for measuring samples using short wavelength radiation | Mehrdad Nikoonahad, Shing Lee, Hidong Kwak, Sergio Edelstein, Guoheng Zhao | 2008-05-06 |
| 7359052 | Systems and methods for measurement of a specimen with vacuum ultraviolet light | John Fielden, Shing Lee | 2008-04-15 |
| 7295325 | Time-resolved measurement technique using radiation pulses | Hidong Kwak, Mehrdad Nikoonahad | 2007-11-13 |
| 7274440 | Systems and methods for measuring stress in a specimen | Shankar Krishnan | 2007-09-25 |
| 7253901 | Laser-based cleaning device for film analysis tool | Patrick M. Maxton | 2007-08-07 |
| 7220964 | Film thickness and composition measurement via auger electron spectroscopy and electron probe microanalysis | Ying Gao | 2007-05-22 |