Patent Leaderboard
USPTO Patent Rankings Data through Sept 30, 2025
GJ

Gary Janik

Kla-Tencor: 38 patents #185 of 1,394Top 15%
WTWyatt Technology: 5 patents #7 of 58Top 15%
STSandisk Technologies: 4 patents #630 of 2,224Top 30%
EIElectric Power Research Institute: 1 patents #421 of 1,201Top 40%
SOSolaicx: 1 patents #3 of 5Top 60%
Palo Alto, CA: #370 of 9,675 inventorsTop 4%
California: #7,932 of 386,348 inventorsTop 3%
Overall (All Time): #54,639 of 4,157,543Top 2%
50 Patents All Time

Issued Patents All Time

Showing 26–50 of 50 patents

Patent #TitleCo-InventorsDate
7202951 Laser-based cleaning device for film analysis tool Patrick M. Maxton 2007-04-10
7196801 Patterned substrate surface mapping Liang Wang, Christopher M. Pohlhammer 2007-03-27
7190441 Methods and systems for preparing a sample for thin film analysis James T. McWhirter, Liang Wang, Hidong Kwak, Haixing Zou, Dan G. Georgesco +3 more 2007-03-13
7166838 X-ray imaging for patterned film measurement 2007-01-23
7139365 X-ray reflectivity system with variable spot 2006-11-21
7110113 Film measurement with interleaved laser cleaning Dan G. Georgesco 2006-09-19
7109735 Method for measuring gate dielectric properties for three dimensional transistors Eric Bouche 2006-09-19
7075073 Angle resolved x-ray detection Jeffrey Allen Moore, Edward James 2006-07-11
7072442 X-ray metrology using a transmissive x-ray optical element 2006-07-04
7067819 Systems and methods for measurement or analysis of a specimen using separated spectral peaks in light 2006-06-27
7039158 Multi-technique thin film analysis tool Jeffrey Allen Moore 2006-05-02
7006596 Light element measurement 2006-02-28
6999180 Optical film topography and thickness measurement Hidong Kwak, Ying Gao, Johannes D. de Veer 2006-02-14
6816570 Multi-technique thin film analysis tool Jeffrey Allen Moore 2004-11-09
6786099 Surface photo-acoustic film measurement device and technique 2004-09-07
6788760 Methods and apparatus for characterizing thin films Roger Kroeze, Murali Narsimhan 2004-09-07
6771735 Method and apparatus for improved x-ray reflection measurement Jeffrey Allen Moore 2004-08-03
6711232 X-ray reflectivity measurement 2004-03-23
6128080 Extended range interferometric refractometer Douglas W. Shepard, Steven P. Trainoff, David T. Phillips 2000-10-03
5900152 Apparatus to reduce inhomogeneities in optical flow cells Douglas W. Shepard, Steven T. Monser 1999-05-04
5676830 Method and apparatus for reducing band broadening in chromatographic detectors Douglas W. Shepard 1997-10-14
5530540 Light scattering measurement cell for very small volumes Philip J. Wyatt 1996-06-25
5475235 Control of laser light power output for use in light scattering instruments by inducing mode hopping and averaging result David T. Phillips 1995-12-12
5404217 Laser liquid flow cell manifold system and method for assembly JOHN FREDERIC MAGOLSKE 1995-04-04
4765736 Frequency modulation spectroscopy using dual frequency modulation and detection Thomas F. Gallagher, Clinton Carlisle 1988-08-23