HL

Howard S. Landis

IBM: 49 patents #1,780 of 70,183Top 3%
GU Globalfoundries U.S.: 1 patents #22 of 211Top 15%
Overall (All Time): #54,635 of 4,157,543Top 2%
50
Patents All Time

Issued Patents All Time

Showing 1–25 of 50 patents

Patent #TitleCo-InventorsDate
10254642 Modifying design layer of integrated circuit (IC) using nested and non-nested fill objects Veeresh V. Deshpande, Arun Sankar Mampazhy, Neelima Mandloi 2019-04-09
9977325 Modifying design layer of integrated circuit (IC) Veeresh V. Deshpande, Arun Sankar Mampazhy, Neelima Mandloi 2018-05-22
9170482 Trimming of dummy fill shapes holes to affect near-neighbor dummy fill shapes with built-in optical proximity corrections for semiconductor applications 2015-10-27
8954901 Parameter variation improvement Pavan Y. Bashaboina, Brent A. Goplen 2015-02-10
8839177 Method and system allowing for semiconductor design rule optimization Mark D. Aubel, Jeanne P. Bickford, Michael Ross, Mark S. Styduhar, Charles H. Windisch, Jr. 2014-09-16
8796133 Optimization metallization for prevention of dielectric cracking under controlled collapse chip connections Griselda Bonilla, Timothy H. Daubenspeck, Mark C. H. Lamorey, Xiao Hu Liu, David L. Questad +2 more 2014-08-05
8739078 Near-neighbor trimming of dummy fill shapes with built-in optical proximity corrections for semiconductor applications 2014-05-27
8507346 Method of forming a semiconductor device having a cut-way hole to expose a portion of a hardmask layer Martin Burkhardt, Matthew E. Colburn, Allen H. Gabor, Oleg Gluschenkov, Scott D. Halle +1 more 2013-08-13
8423945 Methods and systems to meet technology pattern density requirements of semiconductor fabrication processes Jeanne P. Bickford, Allan O. Cruz, Michelle Lynn GILL, David V. MacDonnell, II, Donald J. Samuels +1 more 2013-04-16
8299775 Current-aligned auto-generated non-equiaxial hole shape for wiring David P. Parker, Jeanne-Tania Sucharitaves 2012-10-30
8288821 SOI (silicon on insulator) substrate improvements Alan B. Botula, David S. Collins, Alvin J. Joseph, James A. Slinkman 2012-10-16
8176447 Formation of masks/reticles having dummy features Amit Kumar, Jeanne-Tania Sucharitaves 2012-05-08
8138607 Metal fill structures for reducing parasitic capacitance David S. Collins, Anthony K. Stamper, Janet M. Wilson 2012-03-20
8089126 Method and structures for improving substrate loss and linearity in SOI substrates Alan B. Botula, David S. Collins, Alvin J. Joseph, James A. Slinkman, Anthony K. Stamper 2012-01-03
7930667 System and method of automated wire and via layout optimization description Bette L. Bergman Reuter, Anthony K. Stamper, Jeanne-Tania Sucharitaves 2011-04-19
7888800 Dummy metal fill shapes for improved reliability of hybrid oxide/low-k dielectrics 2011-02-15
7886240 Modifying layout of IC based on function of interconnect and related circuit and design structure James W. Adkisson, Natalie B. Feilchenfeld, Jeffrey P. Gambino, Benjamin T. Voegeli, Steven H. Voldman +1 more 2011-02-08
7861208 Structure for partitioned dummy fill shapes for reduced mask bias with alternating phase shift masks Thomas B. Faure, Jeanne-Tania Sucharitaves 2010-12-28
7858269 Structure and method for sub-resolution dummy clear shapes for improved gate dimensional control David P. Parker, Jeanne-Tania Sucharitaves 2010-12-28
7791166 Formation of dummy features and inductors in semiconductor fabrication Brent A. Anderson, Edward J. Nowak 2010-09-07
7739632 System and method of automated wire and via layout optimization description Bette L. Bergman Reuter, Anthony K. Stamper, Jeanne-Tania Sucharitaves 2010-06-15
7739648 Formation of masks/reticles having dummy features Amit Kumar, Jeanne-Tania Sucharitaves 2010-06-15
7721248 Circuit element function matching despite auto-generated dummy shapes 2010-05-18
7709300 Structure and method for partitioned dummy fill shapes for reduced mask bias with alternating phase shift masks Thomas B. Faure, Jeanne-Tania Sucharitaves 2010-05-04
7709967 Shapes-based migration of aluminum designs to copper damascene Timothy G. Dunham, Ezra D. B. Hall, Mark A. Lavin, William C. Leipold 2010-05-04