| 12166909 |
Computer technology to ensure an electronic design automation (EDA) implementation for electronic circuitry is traceable, auditable, and reproducible |
Ali Asgar SOHANGHPURWALA, Scott HARPER, Jonathan Graf, Carlton FRALEY, Alan COOK |
2024-12-10 |
| 8201132 |
System and method for testing pattern sensitive algorithms for semiconductor design |
David L. DeMaris, William C. Leipold, Daniel N. Maynard, Michael E. Scaman, Shi Zhong |
2012-06-12 |
| 7902866 |
Wires on demand: run-time communication synthesis for reconfigurable computing |
Cameron Patterson, Peter M. Athanas, John K. Bowen, Justin D. Rice, Matthew T. Shelburne +2 more |
2011-03-08 |
| 7876952 |
Removal of relatively unimportant shapes from a set of shapes |
Joseph B. Allen, Valarmathi C. Shanmugam |
2011-01-25 |
| 7709967 |
Shapes-based migration of aluminum designs to copper damascene |
Ezra D. B. Hall, Howard S. Landis, Mark A. Lavin, William C. Leipold |
2010-05-04 |
| 7707535 |
Stitched IC chip layout design structure |
Robert K. Leidy, Kevin N. Ogg, Richard J. Rassel, Valarmathi C. Shanmugam |
2010-04-27 |
| 7703060 |
Stitched IC layout methods, systems and program product |
Robert K. Leidy, Kevin N. Ogg, Richard J. Rassel, Valarmathi C. Shanmugam |
2010-04-20 |
| 7685544 |
Testing pattern sensitive algorithms for semiconductor design |
David L. DeMaris, William C. Leipold, Daniel N. Maynard, Michael E. Scaman, Shi Zhong |
2010-03-23 |
| 7669175 |
Methodology to improve turnaround for integrated circuit design using geometrical hierarchy |
James A. Culp, Maharaj Mukherjee, Mark A. Lavin |
2010-02-23 |
| 7542599 |
Reducing number of relatively unimportant shapes from a set of shapes |
Joseph B. Allen, Valarmathi C. Shanmugam |
2009-06-02 |
| 7498250 |
Shapes-based migration of aluminum designs to copper damascene |
Ezra D. B. Hall, Howard S. Landis, Mark A. Lavin, William C. Leipold |
2009-03-03 |
| 7353472 |
System and method for testing pattern sensitive algorithms for semiconductor design |
David L. DeMaris, William C. Leipold, Daniel N. Maynard, Michael E. Scaman, Shi Zhong |
2008-04-01 |
| 7312141 |
Shapes-based migration of aluminum designs to copper damascene |
Ezra D. B. Hall, Howard S. Landis, Mark A. Lavin, William C. Leipold |
2007-12-25 |
| 7289658 |
Removal of relatively unimportant shapes from a set of shapes |
Joseph B. Allen, Valarmathi C. Shanmugam |
2007-10-30 |
| 7051307 |
Autonomic graphical partitioning |
Gary S. Ditlow, Daria R. Dooling, William C. Leipold, Stephen D. Thomas, Ralph J. Williams |
2006-05-23 |
| 6992002 |
Shapes-based migration of aluminum designs to copper damascence |
Ezra D. B. Hall, Howard S. Landis, Mark A. Lavin, William C. Leipold |
2006-01-31 |
| 6743710 |
Stacked fill structures for support of dielectric layers |
Howard S. Landis, William T. Motsiff |
2004-06-01 |
| 6559543 |
Stacked fill structures for support of dielectric layers |
Howard S. Landis, William T. Motsiff |
2003-05-06 |
| 6528883 |
Shapes-based migration of aluminum designs to copper damascene |
Ezra D. B. Hall, Howard S. Landis, Mark A. Lavin, William C. Leipold |
2003-03-04 |
| 6444581 |
AB etch endpoint by ABFILL compensation |
Paul C. Buschner, Howard S. Landis |
2002-09-03 |
