| 9898573 |
Rule and process assumption co-optimization using feature-specific layout-based statistical analyses |
Chieh-Yu Lin, Dongbing Shao |
2018-02-20 |
$9,359,000 |
| 9836570 |
Semiconductor layout generation |
Atsushi Azuma, Yuping Cui, Marco Facchini, Shaoning Yao |
2017-12-05 |
$14,904,000 |
| 9455186 |
Selective local metal cap layer formation for improved electromigration behavior |
Matthew S. Angyal, Junjing Bao, Griselda Bonilla, Samuel S. Choi, Thomas W. Dyer +4 more |
2016-09-27 |
$4,099,000 |
| 9406560 |
Selective local metal cap layer formation for improved electromigration behavior |
Matthew S. Angyal, Junjing Bao, Griselda Bonilla, Samuel S. Choi, Thomas W. Dyer +4 more |
2016-08-02 |
$5,615,000 |
| 9385038 |
Selective local metal cap layer formation for improved electromigration behavior |
Matthew S. Angyal, Junjing Bao, Griselda Bonilla, Samuel S. Choi, Thomas W. Dyer +4 more |
2016-07-05 |
$5,294,000 |
| 9311443 |
Correcting for stress induced pattern shifts in semiconductor manufacturing |
Dureseti Chidambarrao, Paul C. Parries, Ian P. Stobert |
2016-04-12 |
|
| 9311442 |
Net-voltage-aware optical proximity correction (OPC) |
Shayak Banerjee, Ian P. Stobert |
2016-04-12 |
$1,143,000 |
| 9076847 |
Selective local metal cap layer formation for improved electromigration behavior |
Matthew S. Angyal, Junjing Bao, Griselda Bonilla, Samuel S. Choi, Thomas W. Dyer +4 more |
2015-07-07 |
$5,899,000 |
| 9075106 |
Detecting chip alterations with light emission |
Kerry Bernstein, David F. Heidel, Dirk Pfeiffer, Anthony D. Polson, Peilin Song +2 more |
2015-07-07 |
$5,899,000 |
| 8997028 |
Methods and system for analysis and management of parametric yield |
Paul Chang, Dureseti Chidambarrao, Praveen Elakkumanan, Jason D. Hibbeler, Anda C. Mocuta |
2015-03-31 |
$6,306,000 |
| 8473885 |
Physical design system and method |
John M. Cohn, Ulrich A. Finkler, Fook-Luen Heng, Mark A. Lavin, Jin-Fuw Lee +6 more |
2013-06-25 |
$6,528,000 |
| 8470713 |
Nitride etch for improved spacer uniformity |
John J. Ellis-Monaghan, Jeffrey P. Gambino, Kirk D. Peterson, Jed H. Rankin, Christa R. Willets |
2013-06-25 |
$6,528,000 |
| 8458625 |
Yield enhancement by multiplicate-layer-handling optical correction |
Pavan Y. Bashaboina |
2013-06-04 |
$4,195,000 |
| 8429576 |
Methods and system for analysis and management of parametric yield |
Paul Chang, Dureseti Chidambarrao, Praveen Elakkumanan, Jason D. Hibbeler, Anda C. Mocuta |
2013-04-23 |
$12,549,000 |
| 8418087 |
Analyzing multiple induced systematic and statistical layout dependent effects on circuit performance |
Shayak Banerjee, Dureseti Chidambarrao, Praveen Elakkumanan, Saibal Mukhopadhyay |
2013-04-09 |
$4,611,000 |
| 8381141 |
Method and system for comparing lithographic processing conditions and or data preparation processes |
Stephen E. Fischer, Robert T. Sayah |
2013-02-19 |
$3,959,000 |
| 8347260 |
Method of designing an integrated circuit based on a combination of manufacturability, test coverage and, optionally, diagnostic coverage |
Kerry Bernstein, Leah M. P. Pastel, Kirk D. Peterson, Norman J. Rohrer |
2013-01-01 |
|
| 8347259 |
Circuit enhancement by multiplicate-layer-handling circuit simulation |
Pavan Y. Bashaboina |
2013-01-01 |
|
| 8336008 |
Characterization of long range variability |
Jerry D. Hayes, Ying Liu, Anthony D. Polson |
2012-12-18 |
$19,488,000 |
| 8301290 |
System and method for correcting systematic parametric variations on integrated circuit chips in order to minimize circuit limited yield loss |
John J. Ellis-Monaghan, Jeffrey P. Gambino, Kirk D. Peterson, Jed H. Rankin |
2012-10-30 |
|
| 8302068 |
Leakage aware design post-processing |
Lars Liebmann |
2012-10-30 |
|
| 8239790 |
Methods and system for analysis and management of parametric yield |
Paul Chang, Dureseti Chidambarrao, Praveen Elakkumanan, Jason D. Hibbeler, Anda C. Mocuta |
2012-08-07 |
$7,112,000 |
| 8232215 |
Spacer linewidth control |
Jeffrey P. Gambino, John J. Ellis-Monaghan, Kirk D. Peterson, Jed H. Rankin |
2012-07-31 |
$5,473,000 |
| 8219943 |
Physical design system and method |
John M. Cohn, Ulrich A. Finkler, Fook-Luen Heng, Mark A. Lavin, Jin-Fuw Lee +6 more |
2012-07-10 |
$6,782,000 |
| 8214770 |
Multilayer OPC for design aware manufacturing |
Maharaj Mukherjee, Lars Liebmann, Scott M. Mansfield |
2012-07-03 |
$4,930,000 |
