| 10438902 |
Arc-resistant crackstop |
Vincent J. McGahay, Nicholas A. Polomoff, Anupam ARORA |
2019-10-08 |
| 9836570 |
Semiconductor layout generation |
Atsushi Azuma, Yuping Cui, James A. Culp, Marco Facchini |
2017-12-05 |
| 9324634 |
Semiconductor interconnect structure having a graphene-based barrier metal layer |
Junjing Bao, Xuesong Li, Samuel S. Choi |
2016-04-26 |
| 9324635 |
Semiconductor interconnect structure having a graphene-based barrier metal layer |
Junjing Bao, Samuel S. Choi, Xuesong Li |
2016-04-26 |
| 9018097 |
Semiconductor device processing with reduced wiring puddle formation |
Thomas W. Dyer, Hanako Henry, Tze-man Ko, Yiheng Xu |
2015-04-28 |
| 8623673 |
Structure and method for detecting defects in BEOL processing |
Thomas W. Dyer, Tze-man Ko, Yiheng Xu |
2014-01-07 |
| 8237246 |
Deep trench crackstops under contacts |
Matthew S. Angyal, Lawrence A. Clevenger, Vincent J. McGahay, Satyanarayana V. Nitta |
2012-08-07 |
