Issued Patents All Time
Showing 25 most recent of 33 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8862426 | Method and test system for fast determination of parameter variation statistics | Kanak B. Agarwal, Sani R. Nassif | 2014-10-14 |
| 8676516 | Test circuit for bias temperature instability recovery measurements | Fadi H. Gebara, John P. Keane, Sani R. Nassif, Jeremy D. Schaub | 2014-03-18 |
| 8336008 | Characterization of long range variability | James A. Culp, Ying Liu, Anthony D. Polson | 2012-12-18 |
| 8229683 | Test circuit for bias temperature instability recovery measurements | Fadi H. Gebara, John P. Keane, Sani R. Nassif, Jeremy D. Schaub | 2012-07-24 |
| 8217671 | Parallel array architecture for constant current electro-migration stress testing | Kanak B. Agarwal, Peter A. Habitz, Ying Liu, Deborah M. Massey, Alvin W. Strong | 2012-07-10 |
| 8154309 | Configurable PSRO structure for measuring frequency dependent capacitive loads | Kanak B. Agarwal | 2012-04-10 |
| 8120356 | Measurement methodology and array structure for statistical stress and test of reliabilty structures | Kanak B. Agarwal, Nazmul Habib, John G. Massey, Alvin W. Strong | 2012-02-21 |
| 8089296 | On-chip measurement of signals | Kanak B. Agarwal | 2012-01-03 |
| 7962874 | Method and system for evaluating timing in an integrated circuit | Eric A. Foreman, Peter A. Habitz, David J. Hathaway, Anthony D. Polson | 2011-06-14 |
| 7949482 | Delay-based bias temperature instability recovery measurements for characterizing stress degradation and recovery | Fadi H. Gebara, John P. Keane, Sani R. Nassif, Jeremy D. Schaub | 2011-05-24 |
| 7868640 | Array-based early threshold voltage recovery characterization measurement | Kanak B. Agarwal, Nazmul Habib, John G. Massey, Alvin W. Strong | 2011-01-11 |
| 7870525 | Slack sensitivity to parameter variation based timing analysis | Eric A. Foreman, Peter A. Habitz, David J. Hathaway, Jeffrey H. Oppold, Anthony D. Polson | 2011-01-11 |
| 7865861 | Method of generating wiring routes with matching delay in the presence of process variation | Peter A. Habitz, David J. Hathaway, Anthony D. Polson | 2011-01-04 |
| 7834649 | Method and apparatus for statistical CMOS device characterization | Kanak B. Agarwal, Ying Liu | 2010-11-16 |
| 7823115 | Method of generating wiring routes with matching delay in the presence of process variation | Peter A. Habitz, David J. Hathaway, Anthony D. Polson | 2010-10-26 |
| 7818137 | Characterization circuit for fast determination of device capacitance variation | Kanak B. Agarwal, Sani R. Nassif | 2010-10-19 |
| 7782076 | Method and apparatus for statistical CMOS device characterization | Kanak B. Agarwal, Ying Liu | 2010-08-24 |
| 7768814 | Method and apparatus for measuring statistics of dram parameters with minimum perturbation to cell layout and environment | Kanak B. Argawal | 2010-08-03 |
| 7716616 | Slack sensitivity to parameter variation based timing analysis | Eric A. Foreman, Peter A. Habitz, David J. Hathaway, Jeffrey H. Oppold, Anthony D. Polson | 2010-05-11 |
| 7680626 | System and method of analyzing timing effects of spatial distribution in circuits | David J. Hathaway, Anthony D. Polson | 2010-03-16 |
| 7444608 | Method and system for evaluating timing in an integrated circuit | Eric A. Foreman, Peter A. Habitz, David J. Hathaway, Anthony D. Polson | 2008-10-28 |
| 7418689 | Method of generating wiring routes with matching delay in the presence of process variation | Peter A. Habitz, David J. Hathaway, Anthony D. Polson | 2008-08-26 |
| 7401307 | Slack sensitivity to parameter variation based timing analysis | Eric A. Foreman, Peter A. Habitz, David J. Hathaway, Jeffrey H. Oppold, Anthony D. Polson | 2008-07-15 |
| 7397259 | Method and apparatus for statistical CMOS device characterization | Kanak B. Agarwal, Ying Liu | 2008-07-08 |
| 7302673 | Method and system for performing shapes correction of a multi-cell reticle photomask design | Peter A. Habitz, David J. Hathaway, Anthony D. Polson, Tad J. Wilder | 2007-11-27 |