JK

John P. Keane

IBM: 8 patents #13,150 of 70,183Top 20%
AT Agilent Technologies: 2 patents #1,067 of 3,411Top 35%
KT Keysight Technologies: 2 patents #116 of 567Top 25%
AS American Teleconferencing Services: 1 patents #17 of 31Top 55%
AD Analog Devices: 1 patents #1,102 of 1,943Top 60%
ME Medtronic: 1 patents #4,185 of 6,325Top 70%
Overall (All Time): #305,692 of 4,157,543Top 8%
15
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
12426811 Detection of changes in patient health based on glucose data Kamal Deep Mothilal, Michael D. Eggen, Ning Yu, Shantanu Sarkar, Randal C. Schulhauser +10 more 2025-09-30
12231126 System and method for generating sampling strobe for sampling an input signal Nathaniel Guilar, Robert M. R. Neff 2025-02-18
9767481 Systems, methods, and computer programs for providing advertisements in a conference user interface Boland T. Jones, David Michael Guthrie, Mark A. Sjurseth 2017-09-19
9143147 Calibration of inter-slice gain and offset errors in time-interleaved analog-to- digital converter Sourja Ray 2015-09-22
8776096 Methods for operating system identification and web application execution Michael Andrew Bockus, Jacob Henderson, Kevin R. Sawicki 2014-07-08
8736479 Reducing metastability in analog to digital conversion 2014-05-27
8676516 Test circuit for bias temperature instability recovery measurements Fadi H. Gebara, Jerry D. Hayes, Sani R. Nassif, Jeremy D. Schaub 2014-03-18
8537955 System and method for compensating for loop filter delay Gunter Steinbach 2013-09-17
8229683 Test circuit for bias temperature instability recovery measurements Fadi H. Gebara, Jerry D. Hayes, Sani R. Nassif, Jeremy D. Schaub 2012-07-24
8132109 Webpage magnifier/formatter using CSS properties and cursor/mouse location Michael Andrew Bockus, Kevin R. Sawicki 2012-03-06
7949482 Delay-based bias temperature instability recovery measurements for characterizing stress degradation and recovery Fadi H. Gebara, Jerry D. Hayes, Sani R. Nassif, Jeremy D. Schaub 2011-05-24
7881135 Method for QCRIT measurement in bulk CMOS using a switched capacitor circuit Ethan H. Cannon, Alan J. Drake, Fadi H. Gebara, AJ KleinOsowski 2011-02-01
7548823 Correction of delay-based metric measurements using delay circuits having differing metric sensitivities Harmander Singh, Alan J. Drake, Fadi H. Gebara, Jeremy D. Schaub, Robert M. Senger 2009-06-16
7542862 Calibration of multi-metric sensitive delay measurement circuits Harmander Singh, Alan J. Drake, Fadi H. Gebara, Jeremy D. Schaub, Robert M. Senger 2009-06-02
6323801 Bandgap reference circuit for charge balance circuits Damien McCartney, John O'Dowd, Niall McGuinness 2001-11-27