Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12426811 | Detection of changes in patient health based on glucose data | Kamal Deep Mothilal, Michael D. Eggen, Ning Yu, Shantanu Sarkar, Randal C. Schulhauser +10 more | 2025-09-30 |
| 12231126 | System and method for generating sampling strobe for sampling an input signal | Nathaniel Guilar, Robert M. R. Neff | 2025-02-18 |
| 9767481 | Systems, methods, and computer programs for providing advertisements in a conference user interface | Boland T. Jones, David Michael Guthrie, Mark A. Sjurseth | 2017-09-19 |
| 9143147 | Calibration of inter-slice gain and offset errors in time-interleaved analog-to- digital converter | Sourja Ray | 2015-09-22 |
| 8776096 | Methods for operating system identification and web application execution | Michael Andrew Bockus, Jacob Henderson, Kevin R. Sawicki | 2014-07-08 |
| 8736479 | Reducing metastability in analog to digital conversion | — | 2014-05-27 |
| 8676516 | Test circuit for bias temperature instability recovery measurements | Fadi H. Gebara, Jerry D. Hayes, Sani R. Nassif, Jeremy D. Schaub | 2014-03-18 |
| 8537955 | System and method for compensating for loop filter delay | Gunter Steinbach | 2013-09-17 |
| 8229683 | Test circuit for bias temperature instability recovery measurements | Fadi H. Gebara, Jerry D. Hayes, Sani R. Nassif, Jeremy D. Schaub | 2012-07-24 |
| 8132109 | Webpage magnifier/formatter using CSS properties and cursor/mouse location | Michael Andrew Bockus, Kevin R. Sawicki | 2012-03-06 |
| 7949482 | Delay-based bias temperature instability recovery measurements for characterizing stress degradation and recovery | Fadi H. Gebara, Jerry D. Hayes, Sani R. Nassif, Jeremy D. Schaub | 2011-05-24 |
| 7881135 | Method for QCRIT measurement in bulk CMOS using a switched capacitor circuit | Ethan H. Cannon, Alan J. Drake, Fadi H. Gebara, AJ KleinOsowski | 2011-02-01 |
| 7548823 | Correction of delay-based metric measurements using delay circuits having differing metric sensitivities | Harmander Singh, Alan J. Drake, Fadi H. Gebara, Jeremy D. Schaub, Robert M. Senger | 2009-06-16 |
| 7542862 | Calibration of multi-metric sensitive delay measurement circuits | Harmander Singh, Alan J. Drake, Fadi H. Gebara, Jeremy D. Schaub, Robert M. Senger | 2009-06-02 |
| 6323801 | Bandgap reference circuit for charge balance circuits | Damien McCartney, John O'Dowd, Niall McGuinness | 2001-11-27 |