Issued Patents All Time
Showing 25 most recent of 41 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11601119 | Radiation hardened flip-flop circuit for mitigating single event transients | Salim A. Rabaa, Manuel F. Cabanas-Holmen | 2023-03-07 |
| 11029355 | Direct measurement test structures for measuring static random access memory static noise margin | Mark Gang Yao, Manuel F. Cabanas-Holmen | 2021-06-08 |
| 9223037 | Structure and method to ensure correct operation of an integrated circuit in the presence of ionizing radiation | Michael J. Hauser, Timothy D. Sullivan | 2015-12-29 |
| 9165917 | In-line stacking of transistors for soft error rate hardening | David F. Heidel, K. Paul Muller, Alicia Wang | 2015-10-20 |
| 9013219 | Filtered radiation hardened flip flop with reduced power consumption | Manuel F. Cabanas-Holmen, Salim A. Rabaa | 2015-04-21 |
| 8847621 | Single event transient and upset mitigation for silicon-on-insulator CMOS technology | Salim A. Rabaa, Josh Mackler | 2014-09-30 |
| 8754701 | Interleaved transient filter | Manuel F. Cabanas-Holmen, Salim A. Rabaa | 2014-06-17 |
| 8647909 | Array of alpha particle sensors | Michael J. Hauser, Timothy D. Sullivan | 2014-02-11 |
| 8354858 | Apparatus and method for hardening latches in SOI CMOS devices | AJ KleinOsowski, K. Paul Muller, Tak H. Ning, Philip J. Oldiges, Leon Sigal +2 more | 2013-01-15 |
| 8300452 | Structure and method for improving storage latch susceptibility to single event upsets | Toshiharu Furukawa, David V. Horak, Charles W. Koburger, III, Jack A. Mandelman | 2012-10-30 |
| 8207753 | Method and apparatus for reducing radiation and cross-talk induced data errors | Manuel F. Cabanas-Holmen, Salim A. Rabaa | 2012-06-26 |
| 8138573 | On-chip heater and methods for fabrication thereof and use thereof | Alvin W. Strong | 2012-03-20 |
| 8133772 | Deep trench capacitor for SOI CMOS devices for soft error immunity | John E. Barth, Jr., Kerry Bernstein, Francis R. White | 2012-03-13 |
| 8120131 | Array of alpha particle sensors | Michael J. Hauser, Timothy D. Sullivan | 2012-02-21 |
| 8054099 | Method and apparatus for reducing radiation and cross-talk induced data errors | Manuel F. Cabanas-Holmen, Salim A. Rabaa | 2011-11-08 |
| 8035200 | Neutralization of trapped charge in a charge accumulation layer of a semiconductor structure | John M. Aitken, Alvin W. Strong | 2011-10-11 |
| 7989865 | Deep trench capacitor for SOI CMOS devices for soft error immunity | John E. Barth, Jr., Kerry Bernstein, Francis R. White | 2011-08-02 |
| 7965540 | Structure and method for improving storage latch susceptibility to single event upsets | Toshiharu Furukawa, David V. Horak, Charles W. Koburger, III, Jack A. Mandelman | 2011-06-21 |
| 7943482 | Method for semiconductor device having radiation hardened insulators and design structure thereof | John M. Aitken | 2011-05-17 |
| 7935609 | Method for fabricating semiconductor device having radiation hardened insulators | John M. Aitken | 2011-05-03 |
| 7888959 | Apparatus and method for hardening latches in SOI CMOS devices | AJ KleinOsowski, K. Paul Muller, Tak H. Ning, Philip J. Oldiges, Leon Sigal +2 more | 2011-02-15 |
| 7881135 | Method for QCRIT measurement in bulk CMOS using a switched capacitor circuit | Alan J. Drake, Fadi H. Gebara, John P. Keane, AJ KleinOsowski | 2011-02-01 |
| 7875854 | Design structure for alpha particle sensor in SOI technology and structure thereof | Michael J. Hauser, Timothy D. Sullivan | 2011-01-25 |
| 7795679 | Device structures with a self-aligned damage layer and methods for forming such device structures | Fen Chen | 2010-09-14 |
| 7791123 | Soft error protection structure employing a deep trench | John E. Barth, Jr., Kerry Bernstein | 2010-09-07 |