| 10900923 |
Moisture detection and ingression monitoring systems and methods of manufacture |
Jeffrey P. Gambino, Carole D. Graas, Wen Liu, Prakash Periasamy |
2021-01-26 |
$1,788,000 |
| 10794948 |
Electromigration monitor |
Mukta G. Farooq, John A. Griesemer, Chandrasekaran Kothandaraman, John M. Safran, Timothy D. Sullivan +2 more |
2020-10-06 |
$5,751,000 |
| 10677833 |
Electromigration monitor |
Mukta G. Farooq, John A. Griesemer, Chandrasekaran Kothandaraman, John M. Safran, Timothy D. Sullivan +2 more |
2020-06-09 |
$2,264,000 |
| 10545111 |
Moisture detection and ingression monitoring systems and methods of manufacture |
Jeffrey P. Gambino, Carole D. Graas, Wen Liu, Prakash Periasamy |
2020-01-28 |
$1,679,000 |
| 10545110 |
Moisture detection and ingression monitoring systems and methods of manufacture |
Jeffrey P. Gambino, Carole D. Graas, Wen Liu, Prakash Periasamy |
2020-01-28 |
$1,679,000 |
| 10388567 |
Thru-silicon-via structures |
Mukta G. Farooq, Carole D. Graas, Xiao Hu Liu |
2019-08-20 |
$22,608,000 |
| 10324056 |
Moisture detection and ingression monitoring systems and methods of manufacture |
Jeffrey P. Gambino, Carole D. Graas, Wen Liu, Prakash Periasamy |
2019-06-18 |
$3,033,000 |
| 10309919 |
Moisture detection and ingression monitoring systems and methods of manufacture |
Jeffrey P. Gambino, Carole D. Graas, Wen Liu, Prakash Periasamy |
2019-06-04 |
$2,774,000 |
| 10141274 |
Semiconductor chip with anti-reverse engineering function |
Edward C. Cooney, III, Jonathan M. Pratt, Jason P. Ritter, Patrick S. Spinney, Anna Tilley |
2018-11-27 |
$2,773,000 |
| 10126260 |
Moisture detection and ingression monitoring systems and methods of manufacture |
Jeffrey P. Gambino, Carole D. Graas, Wen Liu, Prakash Periasamy |
2018-11-13 |
$2,931,000 |
| 9891261 |
Electromigration monitor |
Mukta G. Farooq, John A. Griesemer, Chandrasekaran Kothandaraman, John M. Safran, Timothy D. Sullivan +2 more |
2018-02-13 |
$2,196,000 |
| 9893023 |
Semiconductor chip with anti-reverse engineering function |
Edward C. Cooney, III, Jonathan M. Pratt, Jason P. Ritter, Patrick S. Spinney, Anna Tilley |
2018-02-13 |
$2,196,000 |
| 9851398 |
Via leakage and breakdown testing |
Roger A. Dufresne, Charles W. Griffin, Kevin Kolvenbach |
2017-12-26 |
$7,266,000 |
| 9851397 |
Electromigration testing of interconnect analogues having bottom-connected sensory pins |
Cathryn J. Christiansen, Deborah M. Massey, Prakash Periasamy, Michael A. Shinosky |
2017-12-26 |
$7,266,000 |
| 9812359 |
Thru-silicon-via structures |
Mukta G. Farooq, Carole D. Graas, Xiao Hu Liu |
2017-11-07 |
$8,746,000 |
| 9780031 |
Wiring structures |
Cathryn J. Christiansen, Roger A. Dufresne, Charles W. Griffin |
2017-10-03 |
$10,070,000 |
| 9711464 |
Semiconductor chip with anti-reverse engineering function |
Edward C. Cooney, III, Jonathan M. Pratt, Jason P. Ritter, Patrick S. Spinney, Anna Tilley |
2017-07-18 |
$2,009,000 |
| 9613853 |
Copper wire and dielectric with air gaps |
Jeffrey P. Gambino, Zhong-Xiang He, Trevor A. Thompson, Eric J. White |
2017-04-04 |
$2,713,000 |
| 9453873 |
Non-planar field effect transistor test structure and lateral dielectric breakdown testing method |
Roger A. Dufresne, Kevin Kolvenbach, Michael A. Shinosky |
2016-09-27 |
$3,712,000 |
| 9404953 |
Structures and methods for monitoring dielectric reliability with through-silicon vias |
Mukta G. Farooq, John A. Griesemer, Chandrasekharan Kothandaraman, John M. Safran, Timothy D. Sullivan |
2016-08-02 |
$5,615,000 |
| 9318414 |
Integrated circuit structure with through-semiconductor via |
Minhua Lu, Timothy D. Sullivan, Ping-Chuan Wang, Lijuan Zhang |
2016-04-19 |
$757,000 |
| 9318413 |
Integrated circuit structure with metal cap and methods of fabrication |
Andrew Tae Kim, Minhua Lu, Timothy D. Sullivan, Ping-Chuan Wang, Lijuan Zhang |
2016-04-19 |
$757,000 |
| 9287345 |
Semiconductor structure with thin film resistor and terminal bond pad |
Jeffrey P. Gambino, Zhong-Xiang He, Tom C. Lee, John C. Malinowski, Anthony K. Stamper |
2016-03-15 |
$907,000 |
| 9230914 |
Copper wire and dielectric with air gaps |
Jeffrey P. Gambino, Zhong-Xiang He, Trevor A. Thompson, Eric J. White |
2016-01-05 |
$2,535,000 |
| 9159671 |
Copper wire and dielectric with air gaps |
Jeffrey P. Gambino, Zhong-Xiang He, Trevor A. Thompson, Eric J. White |
2015-10-13 |
$3,494,000 |
