Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10900923 | Moisture detection and ingression monitoring systems and methods of manufacture | Fen Chen, Jeffrey P. Gambino, Carole D. Graas, Wen Liu | 2021-01-26 |
| 10545110 | Moisture detection and ingression monitoring systems and methods of manufacture | Fen Chen, Jeffrey P. Gambino, Carole D. Graas, Wen Liu | 2020-01-28 |
| 10545111 | Moisture detection and ingression monitoring systems and methods of manufacture | Fen Chen, Jeffrey P. Gambino, Carole D. Graas, Wen Liu | 2020-01-28 |
| 10510675 | Substrate structure with spatial arrangement configured for coupling of surface plasmons to incident light | Somnath Ghosh, Eswar Ramanathan, Qanit Takmeel, Ming He, Jeric Sarad +4 more | 2019-12-17 |
| 10324056 | Moisture detection and ingression monitoring systems and methods of manufacture | Fen Chen, Jeffrey P. Gambino, Carole D. Graas, Wen Liu | 2019-06-18 |
| 10309919 | Moisture detection and ingression monitoring systems and methods of manufacture | Fen Chen, Jeffrey P. Gambino, Carole D. Graas, Wen Liu | 2019-06-04 |
| 10126260 | Moisture detection and ingression monitoring systems and methods of manufacture | Fen Chen, Jeffrey P. Gambino, Carole D. Graas, Wen Liu | 2018-11-13 |
| 10078183 | Waveguide structures used in phonotics chip packaging | Shawn A. Adderly, Samantha D. DiStefano, Jeffrey P. Gambino, Donald R. Letourneau | 2018-09-18 |
| 9851397 | Electromigration testing of interconnect analogues having bottom-connected sensory pins | Fen Chen, Cathryn J. Christiansen, Deborah M. Massey, Michael A. Shinosky | 2017-12-26 |
| 9543219 | Void monitoring device for measurement of wafer temperature variations | Shawn A. Adderly, Samantha D. DiStefano, Mark Esposito, Jeffrey P. Gambino | 2017-01-10 |