Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11054459 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more | 2021-07-06 |
| 10996259 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more | 2021-05-04 |
| 10989754 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more | 2021-04-27 |
| 10564214 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more | 2020-02-18 |
| 9851397 | Electromigration testing of interconnect analogues having bottom-connected sensory pins | Fen Chen, Cathryn J. Christiansen, Prakash Periasamy, Michael A. Shinosky | 2017-12-26 |
| 9739824 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more | 2017-08-22 |
| 9395403 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, John G. Massey, Pascal A. Nsame, Ernest Y. Wu +1 more | 2016-07-19 |
| 8765568 | Method of fabricating thermally controlled refractory metal resistor | Joseph M. Lukaitis, Timothy D. Sullivan, Ping-Chuan Wang, Kimball M. Watson | 2014-07-01 |
| 8592947 | Thermally controlled refractory metal resistor | Joseph M. Lukaitis, Timothy D. Sullivan, Ping-Chuan Wang, Kimball M. Watson | 2013-11-26 |
| 8217671 | Parallel array architecture for constant current electro-migration stress testing | Kanak B. Agarwal, Peter A. Habitz, Jerry D. Hayes, Ying Liu, Alvin W. Strong | 2012-07-10 |
| 7511378 | Enhancement of performance of a conductive wire in a multilayered substrate | Jason P. Gill, David L. Harmon, Alvin W. Strong, Timothy D. Sullivan, Junichi Furukawa | 2009-03-31 |
| 7512506 | IC chip stress testing | Oliver Aubel, Tom C. Lee, Travis S. Merrill, Stanley W. Polchlopek, Alvin W. Strong +1 more | 2009-03-31 |
| 7096450 | Enhancement of performance of a conductive wire in a multilayered substrate | Jason P. Gill, David L. Harmon, Alvin W. Strong, Timothy D. Sullivan, Junichi Furukawa | 2006-08-22 |