PN

Pascal A. Nsame

IBM: 27 patents #3,831 of 70,183Top 6%
Globalfoundries: 3 patents #1,029 of 4,424Top 25%
Overall (All Time): #124,375 of 4,157,543Top 3%
30
Patents All Time

Issued Patents All Time

Showing 25 most recent of 30 patents

Patent #TitleCo-InventorsDate
11054459 Optimization of integrated circuit reliability Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Ernest Y. Wu +1 more 2021-07-06
10996259 Optimization of integrated circuit reliability Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Ernest Y. Wu +1 more 2021-05-04
10989754 Optimization of integrated circuit reliability Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Ernest Y. Wu +1 more 2021-04-27
10564214 Optimization of integrated circuit reliability Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Ernest Y. Wu +1 more 2020-02-18
10089161 System and method for managing semiconductor manufacturing defects Jeanne P. Bickford, Nazmul Habib, Baozhen Li 2018-10-02
9880892 System and method for managing semiconductor manufacturing defects Jeanne P. Bickford, Nazmul Habib, Baozhen Li 2018-01-30
9739824 Optimization of integrated circuit reliability Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Ernest Y. Wu +1 more 2017-08-22
9557378 Method and structure for multi-core chip product test and selective voltage binning disposition Jeanne P. Bickford, Vikram Iyengar, Rahul K. Nadkarni 2017-01-31
9395403 Optimization of integrated circuit reliability Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Ernest Y. Wu +1 more 2016-07-19
9367493 Method and system of communicating between peer processors in SoC environment Robert J. Devins, David W. Milton 2016-06-14
9310426 On-going reliability monitoring of integrated circuit chips in the field Theodoros E. Anemikos, Douglas S. Dewey, Anthony D. Polson 2016-04-12
9064087 Semiconductor device reliability model and methodologies for use thereof Jeanne P. Bickford, Nazmul Habib, Baozhen Li 2015-06-23
9058250 In-situ computing system failure avoidance Jeanne P. Bickford, Nazmul Habib, Baozhen Li 2015-06-16
9043889 Method and apparatus for secure and reliable computing Mariette Awad, Deanna C. Lim, Daneyand J. Singley, Sebastian T. Ventrone 2015-05-26
8943444 Semiconductor device reliability model and methodologies for use thereof Jeanne P. Bickford, Nazmul Habib, Baozhen Li 2015-01-27
8819460 Dynamic energy management Paul Niekrewicz, Aydin Suren, Sebastian T. Ventrone 2014-08-26
8729920 Circuit and method for RAS-enabled and self-regulated frequency and delay sensor Carole D. Graas, Keith A. Jenkins, Kevin G. Stawiasz 2014-05-20
8549330 Dynamic energy management Paul Niekrewicz, Aydin Suren, Sebastian T. Ventrone 2013-10-01
8499140 Dynamically adjusting pipelined data paths for improved power management Susan K. Lichtensteiger, Sebastian T. Ventrone 2013-07-30
8424071 Method and apparatus for secure and reliable computing Mariette Awad, Deanna C. Lim, Daneyand J. Singley, Sebastian T. Ventrone 2013-04-16
8279861 Real-time VoIP communications using n-Way selective language processing Chi-Chuen Chao-Suren, Ezran D. B. Hall, Aydin Suren, Sebastian T. Ventrone 2012-10-02
8201038 Integrating design for reliability technology into integrated circuits Carole D. Graas 2012-06-12
8086832 Structure for dynamically adjusting pipelined data paths for improved power management Susan K. Lichtensteiger, Sebastian T. Ventrone 2011-12-27
7966589 Structure for dynamic latch state saving device and protocol Anthony J. Perri, Lansing D. Pickup, Sebastian T. Ventrone, Matthew R. Welland 2011-06-21
7849362 Method and system of coherent design verification of inter-cluster interactions Robert J. Devins, David W. Milton 2010-12-07