Issued Patents All Time
Showing 25 most recent of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11901002 | RRAM filament spatial localization using a laser stimulation | Franco Stellari, Takashi Ando, Peilin Song | 2024-02-13 |
| 11489118 | Reliable resistive random access memory | Baozhen Li, Chih-Chao Yang, Andrew Tae Kim | 2022-11-01 |
| 11257750 | E-fuse co-processed with MIM capacitor | Baozhen Li, Chih-Chao Yang, Jim Shih-Chun Liang | 2022-02-22 |
| 11121082 | Sub-ground rule e-Fuse structure | Andrew Tae Kim, Baozhen Li, Chih-Chao Yang | 2021-09-14 |
| 11054459 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more | 2021-07-06 |
| 10996259 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more | 2021-05-04 |
| 10989754 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more | 2021-04-27 |
| 10811353 | Sub-ground rule e-Fuse structure | Baozhen Li, Chih-Chao Yang, Andrew Tae Kim | 2020-10-20 |
| 10804368 | Semiconductor device having two-part spacer | Ruqiang Bao, Junli Wang, Dechao Guo, Heng Wu | 2020-10-13 |
| 10770393 | BEOL thin film resistor | Andrew Tae Kim, Baozhen Li, Chih-Chao Yang | 2020-09-08 |
| 10651083 | Graded interconnect cap | Andrew Tae Kim, Baozhen Li, Chih-Chao Yang | 2020-05-12 |
| 10564214 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more | 2020-02-18 |
| 10262934 | Three plate MIM capacitor via integrity verification | Andrew Tae Kim, Baozhen Li, Barry P. Linder | 2019-04-16 |
| 10229873 | Three plate MIM capacitor via integrity verification | Andrew Tae Kim, Baozhen Li, Barry P. Linder | 2019-03-12 |
| 10103060 | Test structures for dielectric reliability evaluations | David G. Brochu, JR., Roger A. Dufresne, Baozhen Li, Barry P. Linder, James H. Stathis | 2018-10-16 |
| 9739824 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more | 2017-08-22 |
| 9395403 | Optimization of integrated circuit reliability | Carole D. Graas, Nazmul Habib, Deborah M. Massey, John G. Massey, Pascal A. Nsame +1 more | 2016-07-19 |
| 9310418 | Correction for stress induced leakage current in dielectric reliability evaluations | Steven W. Mittl | 2016-04-12 |
| 9287185 | Determining appropriateness of sampling integrated circuit test data in the presence of manufacturing variations | Griselda Bonilla, Baozhen Li, Barry P. Linder, James H. Stathis, Kai Zhao | 2016-03-15 |
| 9026981 | Dielectric reliability assessment for advanced semiconductors | Baozhen Li, James H. Stathis | 2015-05-05 |
| 8839180 | Dielectric reliability assessment for advanced semiconductors | Baozhen Li, James H. Stathis | 2014-09-16 |
| 8352900 | Analytic experimental estimator for impact of voltage-overshoot of voltage waveform on dielectric failure/breakdown | — | 2013-01-08 |
| 7298161 | Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability | Kerry Bernstein, Ronald J. Bolam, Edward J. Nowak, Alvin W. Strong, Jody Van Horn | 2007-11-20 |
| 7011547 | Connector of coaxial cables | — | 2006-03-14 |
| 6891359 | Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability | Kerry Bernstein, Ronald J. Bolam, Edward J. Nowak, Alvin W. Strong, Jody Van Horn | 2005-05-10 |