Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10103060 | Test structures for dielectric reliability evaluations | Roger A. Dufresne, Baozhen Li, Barry P. Linder, James H. Stathis, Ernest Y. Wu | 2018-10-16 |
| 9059281 | Dual L-shaped drift regions in an LDMOS device and method of making the same | John J. Ellis-Monaghan, Michael J. Hauser, Jeffrey B. Johnson, Xuefeng Liu | 2015-06-16 |
| 8754655 | Test structure, method and circuit for simultaneously testing time dependent dielectric breakdown and electromigration or stress migration | Fen Chen, Roger A. Dufresne, Travis S. Merrill, Michael A. Shinosky | 2014-06-17 |
| 8587383 | Measuring bias temperature instability induced ring oscillator frequency degradation | Dimitris P. Ioannou, Travis S. Merrill, Steven W. Mittl | 2013-11-19 |