Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8754655 | Test structure, method and circuit for simultaneously testing time dependent dielectric breakdown and electromigration or stress migration | David G. Brochu, JR., Fen Chen, Roger A. Dufresne, Michael A. Shinosky | 2014-06-17 |
| 8587383 | Measuring bias temperature instability induced ring oscillator frequency degradation | David G. Brochu, JR., Dimitris P. Ioannou, Steven W. Mittl | 2013-11-19 |
| 7512506 | IC chip stress testing | Oliver Aubel, Tom C. Lee, Deborah M. Massey, Stanley W. Polchlopek, Alvin W. Strong +1 more | 2009-03-31 |