Issued Patents All Time
Showing 1–25 of 35 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9404960 | On chip bias temperature instability characterization of a semiconductor device | Hanyi Ding, Xuefeng Liu, Randy L. Wolf | 2016-08-02 |
| 8555216 | Structure for electrically tunable resistor | Icho E. T. Iben | 2013-10-08 |
| 8217671 | Parallel array architecture for constant current electro-migration stress testing | Kanak B. Agarwal, Peter A. Habitz, Jerry D. Hayes, Ying Liu, Deborah M. Massey | 2012-07-10 |
| 8178434 | On-chip embedded thermal antenna for chip cooling | Fen Chen, Jeffrey P. Gambino | 2012-05-15 |
| 8138573 | On-chip heater and methods for fabrication thereof and use thereof | Ethan H. Cannon | 2012-03-20 |
| 8120356 | Measurement methodology and array structure for statistical stress and test of reliabilty structures | Kanak B. Agarwal, Nazmul Habib, Jerry D. Hayes, John G. Massey | 2012-02-21 |
| 8053814 | On-chip embedded thermal antenna for chip cooling | Fen Chen, Jeffrey P. Gambino | 2011-11-08 |
| 8035200 | Neutralization of trapped charge in a charge accumulation layer of a semiconductor structure | John M. Aitken, Ethan H. Cannon | 2011-10-11 |
| 8018017 | Thermo-mechanical cleavable structure | Fen Chen, Cathryn J. Christiansen, Richard S. Kontra, Tom C. Lee, Timothy D. Sullivan +1 more | 2011-09-13 |
| 7868640 | Array-based early threshold voltage recovery characterization measurement | Kanak B. Agarwal, Nazmul Habib, Jerry D. Hayes, John G. Massey | 2011-01-11 |
| 7791169 | Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors | John M. Aitken, Ethan H. Cannon, Philip J. Oldiges | 2010-09-07 |
| 7736915 | Method for neutralizing trapped charge in a charge accumulation layer of a semiconductor structure | John M. Aitken, Ethan H. Cannon | 2010-06-15 |
| 7723200 | Electrically tunable resistor and related methods | Icko E. T. Iben | 2010-05-25 |
| 7704847 | On-chip heater and methods for fabrication thereof and use thereof | Ethan H. Cannon | 2010-04-27 |
| 7511378 | Enhancement of performance of a conductive wire in a multilayered substrate | Jason P. Gill, David L. Harmon, Deborah M. Massey, Timothy D. Sullivan, Junichi Furukawa | 2009-03-31 |
| 7512506 | IC chip stress testing | Oliver Aubel, Tom C. Lee, Deborah M. Massey, Travis S. Merrill, Stanley W. Polchlopek +1 more | 2009-03-31 |
| 7388274 | Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors | John M. Aitken, Ethan H. Cannon, Philip J. Oldiges | 2008-06-17 |
| 7315075 | Capacitor below the buried oxide of SOI CMOS technologies for protection against soft errors | John M. Aitken, Ethan H. Cannon, Philip J. Oldiges | 2008-01-01 |
| 7298161 | Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability | Kerry Bernstein, Ronald J. Bolam, Edward J. Nowak, Jody Van Horn, Ernest Y. Wu | 2007-11-20 |
| 7096450 | Enhancement of performance of a conductive wire in a multilayered substrate | Jason P. Gill, David L. Harmon, Deborah M. Massey, Timothy D. Sullivan, Junichi Furukawa | 2006-08-22 |
| 7064414 | Heater for annealing trapped charge in a semiconductor device | John M. Aitken, Ethan H. Cannon, Philip J. Oldiges | 2006-06-20 |
| 7023041 | Trench capacitor vertical structure | Giuseppe La Rosa, Thomas W. Dyer, Oleg Gluschenkov, Jack A. Mandelman, Carl Radens | 2006-04-04 |
| 6891359 | Circuitry and methodology to establish correlation between gate dielectric test site reliability and product gate reliability | Kerry Bernstein, Ronald J. Bolam, Edward J. Nowak, Jody Van Horn, Ernest Y. Wu | 2005-05-10 |
| 6762966 | Method and circuit to investigate charge transfer array transistor characteristics and aging under realistic stress and its implementation to DRAM MOSFET array transistor | Giuseppe Larosa | 2004-07-13 |
| 6750530 | Semiconductor antifuse with heating element | William A. Klaasen, Ernest Y. Wu | 2004-06-15 |