RK

Richard S. Kontra

IBM: 13 patents #8,581 of 70,183Top 15%
📍 Burlington, VT: #50 of 475 inventorsTop 15%
🗺 Vermont: #578 of 4,968 inventorsTop 15%
Overall (All Time): #383,242 of 4,157,543Top 10%
13
Patents All Time

Issued Patents All Time

Showing 1–13 of 13 patents

Patent #TitleCo-InventorsDate
8945955 Method of changing reflectance or resistance of a region in an optoelectronic memory device Fen Chen, Tom C. Lee, Theodore M. Levin, Christopher D. Muzzy, Timothy D. Sullivan 2015-02-03
8724365 Programmable semiconductor device William R. Tonti, Wayne S. Berry, John A. Fifield, William H. Guthrie 2014-05-13
8288747 Optoelectronic memory devices Fen Chen, Tom C. Lee, Theodore M. Levin, Christopher D. Muzzy, Timothy D. Sullivan 2012-10-16
8184465 Programmable semiconductor device William R. Tonti, Wayne S. Berry, John A. Fifield, William H. Guthrie 2012-05-22
8018017 Thermo-mechanical cleavable structure Fen Chen, Cathryn J. Christiansen, Tom C. Lee, Alvin W. Strong, Timothy D. Sullivan +1 more 2011-09-13
7872897 Programmable semiconductor device William R. Tonti, Wayne S. Berry, John A. Fifield, William H. Guthrie 2011-01-18
7777302 Method of controlling grain size in a polysilicon layer and in semiconductor devices having polysilicon structure Peter J. Geiss, Joseph R. Greco, Emily Lanning 2010-08-17
7768815 Optoelectronic memory devices Fen Chen, Tom C. Lee, Theodore M. Levin, Christopher D. Muzzy, Timothy D. Sullivan 2010-08-03
7247924 Method of controlling grain size in a polysilicon layer and in semiconductor devices having polysilicon structures Peter J. Geiss, Joseph R. Greco, Emily Lanning 2007-07-24
6682992 Method of controlling grain size in a polysilicon layer and in semiconductor devices having polysilicon structures Peter J. Geiss, Joseph R. Greco, Emily Lanning 2004-01-27
6649429 In-line electrical monitor for measuring mechanical stress at the device level on a semiconductor wafer Edward D. Adams, Arne Ballantine, Alain Loiseau, James A. Slinkman 2003-11-18
6441396 In-line electrical monitor for measuring mechanical stress at the device level on a semiconductor wafer Edward D. Adams, Arne Ballantine, Alain Loiseau, James A. Slinkman 2002-08-27
5711858 Process for depositing a conductive thin film upon an integrated circuit substrate Thomas J. Licata, James G. Ryan, Timothy D. Sullivan 1998-01-27