Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
JF

John A. Fifield — 178 Patents

IBM: 156 patents #273 of 70,183Top 1%
Globalfoundries: 16 patents #218 of 4,424Top 5%
Disney: 5 patents #1,393 of 6,686Top 25%
Infineon Technologies Ag: 2 patents #3,286 of 446Top 740%
ASAstronics Advanced Electronic Systems: 1 patents #14 of 28Top 50%
Underhill, VT: #2 of 98 inventorsTop 3%
Vermont: #20 of 4,968 inventorsTop 1%
Overall (All Time): #4,353 of 4,157,543Top 1%
178 Patents All Time
John A. Fifield has been granted 178 US patents while listed as an inventor at IBM. The first was granted in 1984 and the most recent in September 2025. John A. Fifield ranks #4,353 of 4,157,543 US inventors in our database (top 0.10%). Patent records list John A. Fifield in Underhill, VT, US.

Issued Patents All Time

Showing 1–25 of 178 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
RE50596 On-chip reliability monitor and method Eric D. Hunt-Schroeder, Mark D. Jacunski 2025-09-23
10971996 Charge pump circuit with internal pre-charge configuration Eric D. Hunt-Schroeder, Dale E. Pontius 2021-04-06 $75,726,000
10826489 Selection circuit Joseph F. Stormes, Darren L. Anand 2020-11-03 $34,507,000
10707845 Ultra-low voltage level shifter Eric D. Hunt-Schroeder 2020-07-07 $75,806,000
10699771 Voltage boost circuit Dale E. Pontius 2020-06-30 $3,003,000
10673321 Charge pump circuit with built-in-retry Eric D. Hunt-Schroeder, Dale E. Pontius 2020-06-02 $51,675,000
10615797 High speed level translator 2020-04-07 $1,846,000
10535379 Latching current sensing amplifier for memory array Darren L. Anand, Eric D. Hunt-Schroeder, Mark D. Jacunski 2020-01-14 $63,420,000
10446239 Memory array including distributed reference cells for current sensing Eric D. Hunt-Schroeder 2019-10-15 $19,042,000
10438652 Voltage boost circuit Dale E. Pontius 2019-10-08 $4,743,000
10429434 On-chip reliability monitor and method Eric D. Hunt-Schroeder, Mark D. Jacunski 2019-10-01 $27,042,000
10395752 Margin test for multiple-time programmable memory (MTPM) with split wordlines Eric D. Hunt-Schroeder, Darren L. Anand 2019-08-27 $31,250,000
10382049 On-chip calibration circuit and method with half-step resolution Eric D. Hunt-Schroeder 2019-08-13 $55,458,000
10381829 Direct current power distribution and fault protection Jeffrey A. Jouper 2019-08-13 $6,168,000
10255987 Margin test for one-time programmable memory (OTPM) array with common mode current source 2019-04-09 $34,923,000
10224932 High speed level translator 2019-03-05 $2,050,000
10224710 Electrostatic discharge power clamp with fail-safe design Robert J. Gauthier, Jr., Junjun Li 2019-03-05 $2,050,000
10192590 Differential voltage generator Eric D. Hunt-Schroeder 2019-01-29 $16,870,000
10186860 Electrostatic discharge device with fail-safe design Robert J. Gauthier, Jr., Junjun Li 2019-01-22 $16,920,000
10163526 Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing Eric D. Hunt-Schroeder, Darren L. Anand 2018-12-25
10127970 Voltage boost circuit Dale E. Pontius 2018-11-13 $2,931,000
10026494 Word line voltage generator for calculating optimum word line voltage level for programmable memory array Eric D. Hunt-Schroeder 2018-07-17 $10,665,000
10020047 Static random access memory (SRAM) write assist circuit with improved boost Eric D. Hunt-Schroeder, Mark D. Jacunski 2018-07-10 $11,440,000
9953727 Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing Eric D. Hunt-Schroeder, Darren L. Anand 2018-04-24 $8,335,000
9882376 Electrostatic discharge power clamp with fail-safe design Robert J. Gauthier, Jr., Junjun Li 2018-01-30 $2,622,000