Issued Patents All Time
Showing 25 most recent of 178 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE50596 | On-chip reliability monitor and method | Eric D. Hunt-Schroeder, Mark D. Jacunski | 2025-09-23 |
| 10971996 | Charge pump circuit with internal pre-charge configuration | Eric D. Hunt-Schroeder, Dale E. Pontius | 2021-04-06 |
| 10826489 | Selection circuit | Joseph F. Stormes, Darren L. Anand | 2020-11-03 |
| 10707845 | Ultra-low voltage level shifter | Eric D. Hunt-Schroeder | 2020-07-07 |
| 10699771 | Voltage boost circuit | Dale E. Pontius | 2020-06-30 |
| 10673321 | Charge pump circuit with built-in-retry | Eric D. Hunt-Schroeder, Dale E. Pontius | 2020-06-02 |
| 10615797 | High speed level translator | — | 2020-04-07 |
| 10535379 | Latching current sensing amplifier for memory array | Darren L. Anand, Eric D. Hunt-Schroeder, Mark D. Jacunski | 2020-01-14 |
| 10446239 | Memory array including distributed reference cells for current sensing | Eric D. Hunt-Schroeder | 2019-10-15 |
| 10438652 | Voltage boost circuit | Dale E. Pontius | 2019-10-08 |
| 10429434 | On-chip reliability monitor and method | Eric D. Hunt-Schroeder, Mark D. Jacunski | 2019-10-01 |
| 10395752 | Margin test for multiple-time programmable memory (MTPM) with split wordlines | Eric D. Hunt-Schroeder, Darren L. Anand | 2019-08-27 |
| 10382049 | On-chip calibration circuit and method with half-step resolution | Eric D. Hunt-Schroeder | 2019-08-13 |
| 10381829 | Direct current power distribution and fault protection | Jeffrey A. Jouper | 2019-08-13 |
| 10255987 | Margin test for one-time programmable memory (OTPM) array with common mode current source | — | 2019-04-09 |
| 10224932 | High speed level translator | — | 2019-03-05 |
| 10224710 | Electrostatic discharge power clamp with fail-safe design | Robert J. Gauthier, Jr., Junjun Li | 2019-03-05 |
| 10192590 | Differential voltage generator | Eric D. Hunt-Schroeder | 2019-01-29 |
| 10186860 | Electrostatic discharge device with fail-safe design | Robert J. Gauthier, Jr., Junjun Li | 2019-01-22 |
| 10163526 | Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing | Eric D. Hunt-Schroeder, Darren L. Anand | 2018-12-25 |
| 10127970 | Voltage boost circuit | Dale E. Pontius | 2018-11-13 |
| 10026494 | Word line voltage generator for calculating optimum word line voltage level for programmable memory array | Eric D. Hunt-Schroeder | 2018-07-17 |
| 10020047 | Static random access memory (SRAM) write assist circuit with improved boost | Eric D. Hunt-Schroeder, Mark D. Jacunski | 2018-07-10 |
| 9953727 | Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing | Eric D. Hunt-Schroeder, Darren L. Anand | 2018-04-24 |
| 9882376 | Electrostatic discharge power clamp with fail-safe design | Robert J. Gauthier, Jr., Junjun Li | 2018-01-30 |