Issued Patents All Time
Showing 25 most recent of 44 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| RE50596 | On-chip reliability monitor and method | John A. Fifield, Mark D. Jacunski | 2025-09-23 |
| 12361992 | Method and apparatus for faster bitcell operation | Sundar Sankarasubramanian, Dale E. Pontius | 2025-07-15 |
| 12210631 | Method and apparatus for self-destruction of device protected by a physical unclonable function generator | Tian Xia | 2025-01-28 |
| 11962709 | Structures and methods for deriving stable physical unclonable functions from semiconductor devices | Darren L. Anand, Dale E. Pontius | 2024-04-16 |
| 11928248 | Semiconductor device with mechanism to prevent reverse engineering | — | 2024-03-12 |
| 11742858 | Voltage power switch | Darren L. Anand, Michael A. Roberge | 2023-08-29 |
| 11693048 | Cascaded sensing circuits for detecting and monitoring cracks in an integrated circuit | Nicholas A. Polomoff, Dewei Xu | 2023-07-04 |
| 11430505 | In-memory computing using a static random-access memory (SRAM) | Akhilesh Patil | 2022-08-30 |
| 11418195 | Voltage power switch | Darren L. Anand, Michael A. Roberge | 2022-08-16 |
| 11293980 | Customer-transparent logic redundancy for improved yield | Igor Arsovski, John R. Goss, Andrew K. Killorin | 2022-04-05 |
| 11215661 | Cascaded sensing circuits for detecting and monitoring cracks in an integrated circuit | Nicholas A. Polomoff, Dewei Xu | 2022-01-04 |
| 11112811 | On-chip parameter generation system with an integrated calibration circuit | Alexander J. Filmer | 2021-09-07 |
| 11114155 | High-density high-bandwidth static random access memory (SRAM) with phase shifted sequential read | Igor Arsovski, Akhilesh Patil | 2021-09-07 |
| 11105846 | Crack detecting and monitoring system for an integrated circuit | Nicholas A. Polomoff, Dirk Breuer, Bernhard J. Wunder, Dewei Xu | 2021-08-31 |
| 11101010 | Sensing circuits for charge trap transistors | Sebastian T. Ventrone, James A. Svarczkopf, Igor Arsovski | 2021-08-24 |
| 10971996 | Charge pump circuit with internal pre-charge configuration | John A. Fifield, Dale E. Pontius | 2021-04-06 |
| 10955474 | Customer-transparent logic redundancy for improved yield | Igor Arsovski, John R. Goss, Andrew K. Killorin | 2021-03-23 |
| 10839931 | Zero test time memory using background built-in self-test | Igor Arsovski, Michael A. Ziegerhofer | 2020-11-17 |
| 10796750 | Sequential read mode static random access memory (SRAM) | Igor Arsovski, Akhilesh Patil | 2020-10-06 |
| 10770407 | IC structure with interdigitated conductive elements between metal guard structures | Zhuojie Wu, Cathryn J. Christiansen, Erdem Kaltalioglu, Ping-Chuan Wang, Ronald G. Filippi +1 more | 2020-09-08 |
| 10707845 | Ultra-low voltage level shifter | John A. Fifield | 2020-07-07 |
| 10673321 | Charge pump circuit with built-in-retry | John A. Fifield, Dale E. Pontius | 2020-06-02 |
| 10551436 | Customer-transparent logic redundancy for improved yield | Igor Arsovski, John R. Goss, Andrew K. Killorin | 2020-02-04 |
| 10535379 | Latching current sensing amplifier for memory array | Darren L. Anand, John A. Fifield, Mark D. Jacunski | 2020-01-14 |
| 10446239 | Memory array including distributed reference cells for current sensing | John A. Fifield | 2019-10-15 |