Issued Patents All Time
Showing 1–25 of 50 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11962709 | Structures and methods for deriving stable physical unclonable functions from semiconductor devices | Eric D. Hunt-Schroeder, Dale E. Pontius | 2024-04-16 |
| 11742858 | Voltage power switch | Eric D. Hunt-Schroeder, Michael A. Roberge | 2023-08-29 |
| 11418195 | Voltage power switch | Eric D. Hunt-Schroeder, Michael A. Roberge | 2022-08-16 |
| 11367734 | Charge trap memory devices | Faraz Khan, Dan Moy, Norman W. Robson, Robert Katz, Toshiaki Kirihata | 2022-06-21 |
| 10826489 | Selection circuit | Joseph F. Stormes, John A. Fifield | 2020-11-03 |
| 10685705 | Program and erase memory structures | Faraz Khan, Norman W. Robson, Toshiaki Kirihata, Danny Moy | 2020-06-16 |
| 10535379 | Latching current sensing amplifier for memory array | John A. Fifield, Eric D. Hunt-Schroeder, Mark D. Jacunski | 2020-01-14 |
| 10468104 | Robust and error free physical unclonable function using twin-cell charge trap transistor memory | William R. J. Corbin | 2019-11-05 |
| 10395752 | Margin test for multiple-time programmable memory (MTPM) with split wordlines | John A. Fifield, Eric D. Hunt-Schroeder | 2019-08-27 |
| 10163526 | Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing | John A. Fifield, Eric D. Hunt-Schroeder | 2018-12-25 |
| 10062445 | Parallel programming of one time programmable memory array for reduced test time | Eric D. Hunt-Schroeder, Steven H. Lamphier | 2018-08-28 |
| 9953727 | Circuit and method for detecting time dependent dielectric breakdown (TDDB) shorts and signal-margin testing | John A. Fifield, Eric D. Hunt-Schroeder | 2018-04-24 |
| 9779783 | Latching current sensing amplifier for memory array | John A. Fifield, Eric D. Hunt-Schroeder, Mark D. Jacunski | 2017-10-03 |
| 9508420 | Voltage-aware adaptive static random access memory (SRAM) write assist circuit | Eric D. Hunt-Schroeder, John A. Fifield, Kevin A. Batson | 2016-11-29 |
| 9281045 | Refresh hidden eDRAM memory | Venkatraghavan Bringivijayaraghavan, Krishnan S. Rengarajan | 2016-03-08 |
| 8773920 | Reference generator with programmable M and B parameters and methods of use | John A. Fifield | 2014-07-08 |
| 8649239 | Multi-bank random access memory structure with global and local signal buffering for improved performance | John A. Fifield, Mark D. Jacunski, Matthew Christopher Lanahan | 2014-02-11 |
| 8484543 | Fusebay controller structure, system, and method | Kevin W. Gorman, Michael R. Ouellette, Michael A. Ziegerhofer | 2013-07-09 |
| 8028195 | Structure for indicating status of an on-chip power supply system | John A. Fifield, Kevin W. Gorman | 2011-09-27 |
| 7984329 | System and method for providing DRAM device-level repair via address remappings external to the device | Luis A. Lastras-Montano, Jeffrey H. Dreibelbis, Charles A. Kilmer, Warren E. Maule, Robert B. Tremaine | 2011-07-19 |
| 7920003 | Delay circuit with delay equal to percentage of input pulse width | — | 2011-04-05 |
| 7916826 | Diagnostic method and apparatus for non-destructively observing latch data | John R. Goss, Peter O. Jakobsen, Michael R. Ouellette, Thomas O. Sopchak, Donald L. Wheater | 2011-03-29 |
| 7917806 | System and method for indicating status of an on-chip power supply system | John A. Fifield, Kevin W. Gorman | 2011-03-29 |
| 7911820 | Regulating electrical fuse programming current | John A. Fifield, John R. Goss | 2011-03-22 |
| 7895028 | Structure for increasing fuse programming yield | Michael R. Ouellette, Michael A. Ziegerhofer | 2011-02-22 |