DA

Darren L. Anand

IBM: 35 patents #2,774 of 70,183Top 4%
Globalfoundries: 10 patents #365 of 4,424Top 9%
Disney: 4 patents #1,638 of 6,686Top 25%
GU Globalfoundries U.S.: 1 patents #344 of 665Top 55%
📍 Williston, VT: #12 of 203 inventorsTop 6%
🗺 Vermont: #125 of 4,968 inventorsTop 3%
Overall (All Time): #54,157 of 4,157,543Top 2%
50
Patents All Time

Issued Patents All Time

Showing 26–50 of 50 patents

Patent #TitleCo-InventorsDate
7688654 Structure for differential eFUSE sensing without reference fuses John A. Fifield, Michael R. Ouellette 2010-03-30
7609577 Design structure for improving sensing margin of electrically programmable fuses Gregory J. Fredeman, Toshiaki Kirihata, Alan J. Leslie, John M. Safran 2009-10-27
7525831 Method for improving sensing margin of electrically programmable fuses Gregory J. Fredeman, Toshiaki Kirihata, Alan J. Leslie, John M. Safran 2009-04-28
7512915 Embedded test circuit for testing integrated circuits at the die level Nazmul Habib, Robert McMahon, Troy J. Perry 2009-03-31
7477555 System and method for differential eFUSE sensing without reference fuses John A. Fifield, Michael R. Ouellette 2009-01-13
7453973 Diagnostic method and apparatus for non-destructively observing latch data John R. Goss, Peter O. Jacobsen, Michael R. Ouellette, Thomas G. Sopchak, Donald L. Wheater 2008-11-18
7444564 Automatic bit fail mapping for embedded memories with clock multipliers Kevin W. Gorman, Michael R. Nelms 2008-10-28
7382149 System for acquiring device parameters Nazmul Habib, Robert McMahon, Troy J. Perry 2008-06-03
7315193 Circuitry and method for programming an electrically programmable fuse Larry Wissel 2008-01-01
7307911 Apparatus and method for improving sensing margin of electrically programmable fuses Gregory J. Fredeman, Toshiaki Kirihata, Alan J. Leslie, John M. Safran 2007-12-11
7251756 Method and apparatus for increasing fuse programming yield through preferred use of duplicate data Michael R. Ouellette, Michael A. Ziegerhofer 2007-07-31
7243279 Method for separating shift and scan paths on scan-only, single port LSSD latches John E. Barth, Jr., Steven F. Oakland, Michael R. Ouellette 2007-07-10
7170299 Electronic fuse blow mimic and methods for adjusting electronic fuse blow Michael R. Ouellette, Troy J. Perry 2007-01-30
7145977 Diagnostic method and apparatus for non-destructively observing latch data John R. Goss, Peter O. Jakobsen, Michael R. Ouellette, Thomas G. Sopchak, Donald L. Wheater 2006-12-05
7089136 Method for reduced electrical fusing time John E. Barth, Jr., Steven F. Oakland, Michael R. Ouellette 2006-08-08
7061304 Fuse latch with compensated programmable resistive trip point John A. Fifield 2006-06-13
6995585 System and method for implementing self-timed decoded data paths in integrated circuits John E. Barth, Jr. 2006-02-07
6956415 Modular DLL architecture for generating multiple timings Kevin W. Gorman 2005-10-18
6944090 Method and circuit for precise timing of signals in an embedded DRAM array John A. Fifield, Harold Pilo 2005-09-13
6788591 System and method for direct write to dynamic random access memory (DRAM) using PFET bit-switch John E. Barth, Jr. 2004-09-07
6768694 Method of electrically blowing fuses under control of an on-chip tester interface apparatus Bruce Cowan, L. Farnsworth, Pamela S. Gillis, Peter O. Jakobsen, Krishnendu Mondal +3 more 2004-07-27
6728159 Flexible multibanking interface for embedded memory applications John E. Barth, Jr. 2004-04-27
6577156 Method and apparatus for initializing an integrated circuit using compressed data from a remote fusebox John E. Barth, Jr., John A. Fifield, Pamela S. Gillis, Peter O. Jakobsen, Douglas W. Kemerer +4 more 2003-06-10
6552938 Column redundancy system and method for embedded DRAM devices with multibanking capability John E. Barth, Jr. 2003-04-22
5978281 Method and apparatus for preventing postamble corruption within a memory system Robert Tamlyn 1999-11-02