Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10295592 | Pre-test power-optimized bin reassignment following selective voltage binning | Igor Arsovski, Jeanne P. Bickford, Paul J. Grzymkowski, Susan K. Lichtensteiger, Robert McMahon +2 more | 2019-05-21 |
| 9759767 | Pre-test power-optimized bin reassignment following selective voltage binning | Igor Arsovski, Jeanne P. Bickford, Paul J. Grzymkowski, Susan K. Lichtensteiger, Robert McMahon +2 more | 2017-09-12 |
| 9653330 | Threshold voltage (VT)-type transistor sensitive and/or fan-out sensitive selective voltage binning | Jeanne P. Bickford, John R. Goss, Robert McMahon, Thomas G. Sopchak | 2017-05-16 |
| 9514999 | Systems and methods for semiconductor line scribe line centering | Jeanne P. Bickford, Kevin K. Dezfulian, Aurelius L. Graninger, Erik L. Hedberg | 2016-12-06 |
| 8963566 | Thermally adaptive in-system allocation | John R. Goss, Robert McMahon | 2015-02-24 |
| 8570820 | Selectable repair pass masking | Kevin W. Gorman, John R. Goss, Michael R. Ouellette, Michael A. Ziegerhofer | 2013-10-29 |
| 7884599 | HDL design structure for integrating test structures into an integrated circuit design | Nazmul Habib, Robert McMahon | 2011-02-08 |
| 7791972 | Design structure for providing optimal field programming of electronic fuses | Michael R. Ouelette | 2010-09-07 |
| 7653888 | System for and method of integrating test structures into an integrated circuit | Nazmul Habib, Robert McMahon | 2010-01-26 |
| 7518899 | Method of providing optimal field programming of electronic fuses | Michael J. Ouellette | 2009-04-14 |
| 7512915 | Embedded test circuit for testing integrated circuits at the die level | Darren L. Anand, Nazmul Habib, Robert McMahon | 2009-03-31 |
| 7382149 | System for acquiring device parameters | Darren L. Anand, Nazmul Habib, Robert McMahon | 2008-06-03 |
| 7170299 | Electronic fuse blow mimic and methods for adjusting electronic fuse blow | Darren L. Anand, Michael R. Ouellette | 2007-01-30 |