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Pre-test power-optimized bin reassignment following selective voltage binning |
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| 9759767 |
Pre-test power-optimized bin reassignment following selective voltage binning |
Igor Arsovski, Jeanne P. Bickford, Paul J. Grzymkowski, Susan K. Lichtensteiger, Robert McMahon +2 more |
2017-09-12 |
| 9653330 |
Threshold voltage (VT)-type transistor sensitive and/or fan-out sensitive selective voltage binning |
Jeanne P. Bickford, John R. Goss, Robert McMahon, Thomas G. Sopchak |
2017-05-16 |
| 9514999 |
Systems and methods for semiconductor line scribe line centering |
Jeanne P. Bickford, Kevin K. Dezfulian, Aurelius L. Graninger, Erik L. Hedberg |
2016-12-06 |
| 8963566 |
Thermally adaptive in-system allocation |
John R. Goss, Robert McMahon |
2015-02-24 |
| 8570820 |
Selectable repair pass masking |
Kevin W. Gorman, John R. Goss, Michael R. Ouellette, Michael A. Ziegerhofer |
2013-10-29 |
| 7884599 |
HDL design structure for integrating test structures into an integrated circuit design |
Nazmul Habib, Robert McMahon |
2011-02-08 |
| 7791972 |
Design structure for providing optimal field programming of electronic fuses |
Michael R. Ouelette |
2010-09-07 |
| 7653888 |
System for and method of integrating test structures into an integrated circuit |
Nazmul Habib, Robert McMahon |
2010-01-26 |
| 7518899 |
Method of providing optimal field programming of electronic fuses |
Michael J. Ouellette |
2009-04-14 |
| 7512915 |
Embedded test circuit for testing integrated circuits at the die level |
Darren L. Anand, Nazmul Habib, Robert McMahon |
2009-03-31 |
| 7382149 |
System for acquiring device parameters |
Darren L. Anand, Nazmul Habib, Robert McMahon |
2008-06-03 |
| 7170299 |
Electronic fuse blow mimic and methods for adjusting electronic fuse blow |
Darren L. Anand, Michael R. Ouellette |
2007-01-30 |
