Issued Patents All Time
Showing 25 most recent of 28 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12266415 | Reliable electronic fuse based storage using error correction coding | Kevin W. Gorman, Paul J. Grzymkowski | 2025-04-01 |
| 11295829 | Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | Aravindan J. Busi, Paul J. Grzymkowski, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more | 2022-04-05 |
| 11293980 | Customer-transparent logic redundancy for improved yield | Igor Arsovski, Eric D. Hunt-Schroeder, Andrew K. Killorin | 2022-04-05 |
| 10971243 | Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | Aravindan J. Busi, Paul J. Grzymkowski, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more | 2021-04-06 |
| 10955474 | Customer-transparent logic redundancy for improved yield | Igor Arsovski, Eric D. Hunt-Schroeder, Andrew K. Killorin | 2021-03-23 |
| 10692584 | Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | Aravindan J. Busi, Paul J. Grzymkowski, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more | 2020-06-23 |
| 10553302 | Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | Aravindan J. Busi, Paul J. Grzymkowski, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more | 2020-02-04 |
| 10551436 | Customer-transparent logic redundancy for improved yield | Igor Arsovski, Eric D. Hunt-Schroeder, Andrew K. Killorin | 2020-02-04 |
| 9881694 | Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | Aravindan J. Busi, Paul J. Grzymkowski, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more | 2018-01-30 |
| 9791507 | Customer-transparent logic redundancy for improved yield | Igor Arsovski, Eric D. Hunt-Schroeder, Andrew K. Killorin | 2017-10-17 |
| 9760673 | Application specific integrated circuit (ASIC) test screens and selection of such screens | Eric D. Hunt-Schroeder, Igor Arsovski, Paul J. Grzymkowski | 2017-09-12 |
| 9653330 | Threshold voltage (VT)-type transistor sensitive and/or fan-out sensitive selective voltage binning | Jeanne P. Bickford, Robert McMahon, Troy J. Perry, Thomas G. Sopchak | 2017-05-16 |
| 9274171 | Customer-transparent logic redundancy for improved yield | Igor Arsovski, Eric D. Hunt-Schroeder, Andrew K. Killorin | 2016-03-01 |
| 8963566 | Thermally adaptive in-system allocation | Robert McMahon, Troy J. Perry | 2015-02-24 |
| 8949767 | Reliability evaluation and system fail warning methods using on chip parametric monitors | Jeanne P. Bickford, Nazmul Habib, Robert McMahon | 2015-02-03 |
| 8570820 | Selectable repair pass masking | Kevin W. Gorman, Michael R. Ouellette, Troy J. Perry, Michael A. Ziegerhofer | 2013-10-29 |
| 8504975 | Reliability evaluation and system fail warning methods using on chip parametric monitors | Jeanne P. Bickford, Nazmul Habib, Robert McMahon | 2013-08-06 |
| 8095907 | Reliability evaluation and system fail warning methods using on chip parametric monitors | Jeanne P. Bickford, Nazmul Habib, Robert McMahon | 2012-01-10 |
| 7916826 | Diagnostic method and apparatus for non-destructively observing latch data | Darren L. Anand, Peter O. Jakobsen, Michael R. Ouellette, Thomas O. Sopchak, Donald L. Wheater | 2011-03-29 |
| 7911820 | Regulating electrical fuse programming current | Darren L. Anand, John A. Fifield | 2011-03-22 |
| 7904839 | System and method for controlling access to addressable integrated circuits | Paul J. Grzymkowski, Robert McMahon | 2011-03-08 |
| 7831936 | Structure for a system for controlling access to addressable integrated circuits | Paul J. Grzymkowski, Robert McMahon | 2010-11-09 |
| 7656182 | Testing method using a scalable parametric measurement macro | Jeanne P. Bickford, Nazmul Habib, Robert McMahon | 2010-02-02 |
| 7560946 | Method of acceptance for semiconductor devices | Jeanne P. Bickford, Nazmul Habib, Robert McMahon | 2009-07-14 |
| 7487477 | Parametric-based semiconductor design | Jeanne P. Bickford, Nazmul Habib, Robert McMahon | 2009-02-03 |