Issued Patents All Time
Showing 1–13 of 13 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11669733 | Processing unit and method for computing a convolution using a hardware-implemented spiral algorithm | Deepak I. Hanagandi, Venkatraghavan Bringivijayaraghavan | 2023-06-06 |
| 11580059 | Multi-port memory architecture for a systolic array | Venkatraghavan Bringivijayaraghavan, Deepak I. Hanagandi, Igor Arsovski | 2023-02-14 |
| 11295829 | Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | John R. Goss, Paul J. Grzymkowski, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more | 2022-04-05 |
| 10971243 | Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | John R. Goss, Paul J. Grzymkowski, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more | 2021-04-06 |
| 10692584 | Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | John R. Goss, Paul J. Grzymkowski, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more | 2020-06-23 |
| 10622090 | Arbitration for memory diagnostics | Kevin W. Gorman, Deepak I. Hanagandi, Kiran K. Narayan, Michael R. Ouellette | 2020-04-14 |
| 10553302 | Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | John R. Goss, Paul J. Grzymkowski, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more | 2020-02-04 |
| 10490296 | Memory built-in self-test (MBIST) test time reduction | Michael R. Ouellette, Deepak I. Hanagandi, Kiran K. Narayan, Michael A. Ziegerhofer | 2019-11-26 |
| 10153055 | Arbitration for memory diagnostics | Kevin W. Gorman, Deepak I. Hanagandi, Kiran K. Narayan, Michael R. Ouellette | 2018-12-11 |
| 9881694 | Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register | John R. Goss, Paul J. Grzymkowski, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more | 2018-01-30 |
| 9761329 | Built-in self-test (BIST) circuit and associated BIST method for embedded memories | Deepak I. Hanagandi, Krishnendu Mondal, Michael R. Ouellette | 2017-09-12 |
| 9715942 | Built-in self-test (BIST) circuit and associated BIST method for embedded memories | Deepak I. Hanagandi, Krishnendu Mondal, Michael R. Ouellette | 2017-07-25 |
| 9514844 | Fast auto shift of failing memory diagnostics data using pattern detection | Kevin W. Gorman, Kiran K. Narayan, Michael R. Ouellette | 2016-12-06 |