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Reliable electronic fuse based storage using error correction coding |
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2025-04-01 |
| 11295829 |
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register |
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2022-04-05 |
| 10971243 |
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register |
Aravindan J. Busi, John R. Goss, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more |
2021-04-06 |
| 10692584 |
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register |
Aravindan J. Busi, John R. Goss, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more |
2020-06-23 |
| 10553302 |
Built-in self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register |
Aravindan J. Busi, John R. Goss, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more |
2020-02-04 |
| 10295592 |
Pre-test power-optimized bin reassignment following selective voltage binning |
Igor Arsovski, Jeanne P. Bickford, Susan K. Lichtensteiger, Robert McMahon, Troy J. Perry +2 more |
2019-05-21 |
| 9881694 |
Built-in-self-test (BIST) engine configured to store a per pattern based fail status in a pattern mask register |
Aravindan J. Busi, John R. Goss, Krishnendu Mondal, Kiran K. Narayan, Michael R. Ouellette +1 more |
2018-01-30 |
| 9759767 |
Pre-test power-optimized bin reassignment following selective voltage binning |
Igor Arsovski, Jeanne P. Bickford, Susan K. Lichtensteiger, Robert McMahon, Troy J. Perry +2 more |
2017-09-12 |
| 9760673 |
Application specific integrated circuit (ASIC) test screens and selection of such screens |
Eric D. Hunt-Schroeder, John R. Goss, Igor Arsovski |
2017-09-12 |
| 7904839 |
System and method for controlling access to addressable integrated circuits |
John R. Goss, Robert McMahon |
2011-03-08 |
| 7831936 |
Structure for a system for controlling access to addressable integrated circuits |
John R. Goss, Robert McMahon |
2010-11-09 |
