Issued Patents All Time
Showing 1–18 of 18 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10539611 | Integrated circuit chip reliability qualification using a sample-specific expected fail rate | Nazmul Habib, Baozhen Li, Tad J. Wilder | 2020-01-21 |
| 10089161 | System and method for managing semiconductor manufacturing defects | Nazmul Habib, Baozhen Li, Pascal A. Nsame | 2018-10-02 |
| 9891275 | Integrated circuit chip reliability qualification using a sample-specific expected fail rate | Nazmul Habib, Baozhen Li, Tad J. Wilder | 2018-02-13 |
| 9880892 | System and method for managing semiconductor manufacturing defects | Nazmul Habib, Baozhen Li, Pascal A. Nsame | 2018-01-30 |
| 9489482 | Reliability-optimized selective voltage binning | Nazmul Habib, Baozhen Li, Tad J. Wilder | 2016-11-08 |
| 9354953 | System integrator and system integration method with reliability optimized integrated circuit chip selection | Nazmul Habib, Baozhen Li | 2016-05-31 |
| 9255962 | Determining intra-die variation of an integrated circuit | Aurelius L. Graninger, Christopher T. McEvoy, Joseph J. Oler, Jr. | 2016-02-09 |
| 9058250 | In-situ computing system failure avoidance | Nazmul Habib, Baozhen Li, Pascal A. Nsame | 2015-06-16 |
| 8966431 | Semiconductor timing improvement | Howard B. Druckerman, Erik L. Hedberg, Joseph J. Oler, Jr. | 2015-02-24 |
| 8949767 | Reliability evaluation and system fail warning methods using on chip parametric monitors | John R. Goss, Nazmul Habib, Robert McMahon | 2015-02-03 |
| 8943444 | Semiconductor device reliability model and methodologies for use thereof | Nazmul Habib, Baozhen Li, Pascal A. Nsame | 2015-01-27 |
| 8726201 | Method and system to predict a number of electromigration critical elements | Peter A. Habitz, Baozhen Li, Paul S. McLaughlin, Dileep N. Netrabile | 2014-05-13 |
| 8694936 | Terminal metal connection inspection | Donald S. Kent, Gerard Nuzback | 2014-04-08 |
| 8504975 | Reliability evaluation and system fail warning methods using on chip parametric monitors | John R. Goss, Nazmul Habib, Robert McMahon | 2013-08-06 |
| 7803644 | Across reticle variation modeling and related reticle | Bruce Balch, Nazmul Habib, Phung T. Nguyen | 2010-09-28 |
| 7386549 | Integration of business process and use of fields in a master database | Ernest Burger, Thomas R. Maheux, Paul G. McLaughlin | 2008-06-10 |
| 6850904 | Relational database for producing bill-of-materials from planning information | Donald F. Ballas, Thomas R. Maheux, Paul G. McLaughlin, Donald L. Poulin | 2005-02-01 |
| 6819967 | Relational database for producing bill-of-materials from planning information | Donald F. Ballas, Thomas R. Maheux, Paul G. McLaughlin, Donald L. Poulin | 2004-11-16 |