Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9082875 | Methods for normalizing strain in semicondcutor devices and strain normalized semiconductor devices | Kerry Bernstein, John J. Ellis-Monaghan, Nazmul Habib | 2015-07-14 |
| 8521500 | Method and device for measuring integrated circuit power supply noise and calibration of power supply noise analysis models | Igor Arsovski, Umberto Garofano, Nazmul Habib | 2013-08-27 |
| 8298876 | Methods for normalizing strain in semiconductor devices and strain normalized semiconductor devices | Kerry Bernstein, John J. Ellis-Monaghan, Nazmul Habib | 2012-10-30 |
| 8020138 | Voltage island performance/leakage screen monitor for IP characterization | Nazmul Habib, Susan K. Lichtensteiger, Daniel Stasiak, Richard A. Wachnik | 2011-09-13 |
| 7803644 | Across reticle variation modeling and related reticle | Jeanne P. Bickford, Nazmul Habib, Phung T. Nguyen | 2010-09-28 |