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Diagnostic method and apparatus for non-destructively observing latch data |
Darren L. Anand, John R. Goss, Michael R. Ouellette, Thomas O. Sopchak, Donald L. Wheater |
2011-03-29 |
| 7145977 |
Diagnostic method and apparatus for non-destructively observing latch data |
Darren L. Anand, John R. Goss, Michael R. Ouellette, Thomas G. Sopchak, Donald L. Wheater |
2006-12-05 |
| 6768694 |
Method of electrically blowing fuses under control of an on-chip tester interface apparatus |
Darren L. Anand, Bruce Cowan, L. Farnsworth, Pamela S. Gillis, Krishnendu Mondal +3 more |
2004-07-27 |
| 6577156 |
Method and apparatus for initializing an integrated circuit using compressed data from a remote fusebox |
Darren L. Anand, John E. Barth, Jr., John A. Fifield, Pamela S. Gillis, Douglas W. Kemerer +4 more |
2003-06-10 |
| 6452848 |
Programmable built-in self test (BIST) data generator for semiconductor memory devices |
Thomas E. Obremski, Jeffrey H. Dreibelbis |
2002-09-17 |
