Issued Patents All Time
Showing 1–15 of 15 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8423844 | Dense register array for enabling scan out observation of both L1 and L2 latches | David E. Lackey, Steven F. Oakland, Jeffery H. Oppold | 2013-04-16 |
| 8381050 | Method and apparatus for increased effectiveness of delay and transition fault testing | Jack R. Smith, Tad J. Wilder, Francis Woytowich, Tian Xia | 2013-02-19 |
| 8230283 | Method to test hold path faults using functional clocking | Vikram Iyengar, Steven F. Oakland | 2012-07-24 |
| 8181135 | Hold transition fault model and test generation method | Vikram Iyengar, David E. Lackey, Steven F. Oakland | 2012-05-15 |
| 7478301 | Partial good integrated circuit and method of testing same | Leonard O. Farnsworth, III, Michael Z. Felske, Benjamin P. Lynch, Michael R. Ouellette, Thomas St. Pierre +2 more | 2009-01-13 |
| 7305600 | Partial good integrated circuit and method of testing same | Leonard O. Farnsworth, III, Michael Z. Felske, Benjamin P. Lynch, Michael R. Ouellette, Thomas St.Pierre +2 more | 2007-12-04 |
| 7281182 | Method and circuit using boundary scan cells for design library analysis | David D. Litten, Steven F. Oakland | 2007-10-09 |
| 7010733 | Parametric testing for high pin count ASIC | Robert W. Bassett, Garrett S Christensen, Michael Combs, L. Farnsworth | 2006-03-07 |
| 6768694 | Method of electrically blowing fuses under control of an on-chip tester interface apparatus | Darren L. Anand, Bruce Cowan, L. Farnsworth, Peter O. Jakobsen, Krishnendu Mondal +3 more | 2004-07-27 |
| 6656751 | Self test method and device for dynamic voltage screen functionality improvement | John E. Andersen, Bruce Cowan, Steven F. Oakland, Michael R. Ouellette | 2003-12-02 |
| 6577156 | Method and apparatus for initializing an integrated circuit using compressed data from a remote fusebox | Darren L. Anand, John E. Barth, Jr., John A. Fifield, Peter O. Jakobsen, Douglas W. Kemerer +4 more | 2003-06-10 |
| 6058496 | Self-timed AC CIO wrap method and apparatus | Kevin William McCauley, Ronald J. Prilik, Donald L. Wheater, Francis Woytowich | 2000-05-02 |
| 5925143 | Scan-bypass architecture without additional external latches | Ravi Kolagotla, Dennis A. Miller, Maria Noack, Steven F. Oakland, Chris J. Rebeor +2 more | 1999-07-20 |
| 5719879 | Scan-bypass architecture without additional external latches | Ravi Kolagotla, Dennis A. Miller, Maria Noack, Steven F. Oakland, Chris J. Rebeor +2 more | 1998-02-17 |
| 5127008 | Integrated circuit driver inhibit control test method | Robert W. Bassett, Jeannie Therese Harrigan Panner, Douglas W. Stout, Mark Turner | 1992-06-30 |