Issued Patents All Time
Showing 25 most recent of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10424821 | Thermally regulated modular energy storage device and methods | Omeed Badkoobeh | 2019-09-24 |
| 9557378 | Method and structure for multi-core chip product test and selective voltage binning disposition | Jeanne P. Bickford, Rahul K. Nadkarni, Pascal A. Nsame | 2017-01-31 |
| 9104834 | Systems and methods for single cell product path delay analysis | Jeanne P. Bickford, Peter A. Habitz, Brian Worth, Jinjun Xiong | 2015-08-11 |
| 9058034 | Integrated circuit product yield optimization using the results of performance path testing | Jeanne P. Bickford, Peter A. Habitz, Jinjun Xiong | 2015-06-16 |
| 9043180 | Reducing power consumption during manufacturing test of an integrated circuit | Animesh Khare, Kenneth Pichamuthu | 2015-05-26 |
| 8996282 | Fueling systems, methods and apparatus for an internal combustion engine | Shizuo Sasaki, Jayant V. Sarlashkar, Gary D. Neely | 2015-03-31 |
| 8904329 | Systems and methods for single cell product path delay analysis | Jeanne P. Bickford, Peter A. Habitz, Brian Worth, Jinjun Xiong | 2014-12-02 |
| 8825433 | Automatic generation of valid at-speed structural test (ASST) test groups | Konda R. Baalaji, Malede W. Berhanu, Douglas C. Pricer | 2014-09-02 |
| 8543966 | Test path selection and test program generation for performance testing integrated circuit chips | Jeanne P. Bickford, Peter A. Habitz, David E. Lackey, Jinjun Xiong | 2013-09-24 |
| 8538718 | Clock edge grouping for at-speed test | Gary D. Grise, Douglas E. Sprague, Mark R. Taylor | 2013-09-17 |
| 8539429 | System yield optimization using the results of integrated circuit chip performance path testing | Jeanne P. Bickford, Peter A. Habitz | 2013-09-17 |
| 8490040 | Disposition of integrated circuits using performance sort ring oscillator and performance path testing | Jeanne P. Bickford, Peter A. Habitz, David E. Lackey, Jinjun Xiong | 2013-07-16 |
| 8230283 | Method to test hold path faults using functional clocking | Pamela S. Gillis, Steven F. Oakland | 2012-07-24 |
| 8209141 | System and method for automatically generating test patterns for at-speed structural test of an integrated circuit device using an incremental approach to reduce test pattern count | Robert W. Bassett, Andrew Ferko | 2012-06-26 |
| 8181135 | Hold transition fault model and test generation method | Pamela S. Gillis, David E. Lackey, Steven F. Oakland | 2012-05-15 |
| 8176362 | Online multiprocessor system reliability defect testing | Monty M. Denneau, Phillip J. Nigh | 2012-05-08 |
| 7996807 | Integrated test waveform generator (TWG) and customer waveform generator (CWG), design structure and method | Gary D. Grise, David E. Lackey, David W. Milton | 2011-08-09 |
| 7856607 | System and method for generating at-speed structural tests to improve process and environmental parameter space coverage | Gary D. Grise, Peter A. Habitz, David E. Lackey, Chandramouli Visweswariah, Vladimir Zolotov | 2010-12-21 |
| 7793176 | Method of increasing path coverage in transition test generation | Gary D. Grise, David J. Hathaway | 2010-09-07 |
| 7784000 | Identifying sequential functional paths for IC testing methods and system | Gary D. Grise | 2010-08-24 |
| 7779375 | Design structure for shutting off data capture across asynchronous clock domains during at-speed testing | Gary D. Grise, Mark R. Taylor | 2010-08-17 |
| 7721170 | Apparatus and method for selectively implementing launch off scan capability in at speed testing | Gary D. Grise, David E. Lackey, Mark R. Taylor | 2010-05-18 |
| 7685542 | Method and apparatus for shutting off data capture across asynchronous clock domains during at-speed testing | Gary D. Grise, Mark R. Taylor | 2010-03-23 |
| 7620921 | IC chip at-functional-speed testing with process coverage evaluation | Eric A. Foreman, Gary D. Grise, Peter A. Habitz, David E. Lackey, Chandramouli Visweswariah +2 more | 2009-11-17 |
| 7529294 | Testing of multiple asynchronous logic domains | Gary D. Grise, David E. Lackey | 2009-05-05 |