Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8209141 | System and method for automatically generating test patterns for at-speed structural test of an integrated circuit device using an incremental approach to reduce test pattern count | Andrew Ferko, Vikram Iyengar | 2012-06-26 |
| 7010733 | Parametric testing for high pin count ASIC | Garrett S Christensen, Michael Combs, L. Farnsworth, Pamela S. Gillis | 2006-03-07 |
| 6804803 | Method for testing integrated logic circuits | Carl Barnhart, Brion Keller, David E. Lackey, Mark R. Taylor, Donald L. Wheater | 2004-10-12 |
| 6757856 | Apparatus and method for hardware-assisted diagnosis of broken logic-test shift-registers | — | 2004-06-29 |
| 5127008 | Integrated circuit driver inhibit control test method | Pamela S. Gillis, Jeannie Therese Harrigan Panner, Douglas W. Stout, Mark Turner | 1992-06-30 |
| 4878209 | Macro performance test | William R. Griffin, Susan A. Murphy, John G. Petrovick, Jr., James R. Varner, Dennis Whittaker | 1989-10-31 |