Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7010733 | Parametric testing for high pin count ASIC | Robert W. Bassett, Garrett S Christensen, Michael Combs, Pamela S. Gillis | 2006-03-07 |
| 6996791 | Method for optimizing a set of scan diagnostic patterns | Vanessa Brunkhorst, Frank Distler, Alan R. Humphrey, Kevin W. Stanley | 2006-02-07 |
| 6901542 | Internal cache for on chip test data storage | Thomas Bartenstein, Douglas C. Heaberlin, Edward E. Horton, III, Leendert M. Huisman, Leah Pastel +3 more | 2005-05-31 |
| 6782501 | System for reducing test data volume in the testing of logic products | Frank Distler, Andrew Ferko, Brion Keller, Bernd Koenemann | 2004-08-24 |
| 6768694 | Method of electrically blowing fuses under control of an on-chip tester interface apparatus | Darren L. Anand, Bruce Cowan, Pamela S. Gillis, Peter O. Jakobsen, Krishnendu Mondal +3 more | 2004-07-27 |
| 6708305 | Deterministic random LBIST | Brion Keller, Bernd Koenemann, Timothy J. Koprowski, Thomas J. Snethen, Donald L. Wheater | 2004-03-16 |