Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7587646 | Test pattern generation in residue networks | Carolyn Asher | 2009-09-08 |
| 6708305 | Deterministic random LBIST | L. Farnsworth, Brion Keller, Bernd Koenemann, Timothy J. Koprowski, Donald L. Wheater | 2004-03-16 |
| 5691990 | Hybrid partial scan method | Rohit Kapur, Kamran Zarrineh | 1997-11-25 |