| 8166360 |
Direct logic diagnostics with signature-based fault dictionaries |
Manish Sharma |
2012-04-24 |
| 7725849 |
Feature failure correlation |
David Abercrombie |
2010-05-25 |
| 7509551 |
Direct logic diagnostics with signature-based fault dictionaries |
Manish Sharma |
2009-03-24 |
| 7435990 |
Arrangement for testing semiconductor chips while incorporated on a semiconductor wafer |
Brion Keller, David E. Lackey, Donald L. Wheater |
2008-10-14 |
| 7103816 |
Method and system for reducing test data volume in the testing of logic products |
Frank Distler, Leonard O. Farnsworth, III, Andrew Ferko, Brion Keller, Donald L. Wheater |
2006-09-05 |
| 6782501 |
System for reducing test data volume in the testing of logic products |
Frank Distler, L. Farnsworth, Andrew Ferko, Brion Keller |
2004-08-24 |
| 6708305 |
Deterministic random LBIST |
L. Farnsworth, Brion Keller, Timothy J. Koprowski, Thomas J. Snethen, Donald L. Wheater |
2004-03-16 |
| 6611933 |
Real-time decoder for scan test patterns |
Carl Barnhart, Brion Keller |
2003-08-26 |
| 6041429 |
System for test data storage reduction |
— |
2000-03-21 |
| 5617426 |
Clocking mechanism for delay, short path and stuck-at testing |
William H. McAnney, Mark L. Shulman |
1997-04-01 |
| 5612963 |
Hybrid pattern self-testing of integrated circuits |
Kenneth D. Wagner, John A. Waicukauski |
1997-03-18 |
| 5375091 |
Method and apparatus for memory dynamic burn-in and test |
Robert W. Berry, Jr., William J. Scarpero, Jr., Philip G. Shephard, III, Kenneth D. Wagner, Gulsun Yasar |
1994-12-20 |
