Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7870515 | System and method for improved hierarchical analysis of electronic circuits | Ravichander Ledalla, Vasant Rao, Jeffrey P. Soreff | 2011-01-11 |
| 7552413 | System and computer program for verifying performance of an array by simulating operation of edge cells in a full array model | Vikas Agarwal, Michael Ju Hyeok Lee | 2009-06-23 |
| 7474574 | Shift register latch with embedded dynamic random access memory scan only cell | Vikas Agarwal, Sam Gat-Shang Chu, Saiful Islam | 2009-01-06 |
| 7424691 | Method for verifying performance of an array by simulating operation of edge cells in a full array model | Vikas Agarwal, Michael Ju Hyeok Lee | 2008-09-09 |
| 7099201 | Multifunctional latch circuit for use with both SRAM array and self test device | Andrew James Bianchi, Yuen H. Chan, William V. Huott, Michael Ju Hyeok Lee, Edelmar Seewann | 2006-08-29 |
| 7073106 | Test method for guaranteeing full stuck-at-fault coverage of a memory array | Jose Angel Paredes, Timothy M. Skergan, Neil Ray Vanderschaaf | 2006-07-04 |
| 6662133 | JTAG-based software to perform cumulative array repair | Christopher J. Engel, Norman K. James, Brian Chan Monwai, Kevin F. Reick, Marco Zamora | 2003-12-09 |
| 6564344 | System and method of generating dynamic word line from the content addressable memory (CAM) “hit/miss” signal which is scannable for testability | Chi Duy Bui, T. W. Griffith, Jr., Manoj Kumar, Terry Lee Leasure | 2003-05-13 |
| 6553525 | Method and apparatus for selectively enabling and disabling functions on a per array basis | — | 2003-04-22 |
| 6553526 | Programmable array built-in self test method and system for arrays with imbedded logic | — | 2003-04-22 |
| 6553527 | Programmable array built-in self test method and controller with programmable expect generator | — | 2003-04-22 |
| 6523145 | Method and apparatus for testing a contents-addressable-memory-type structure using a simultaneous write-thru mode | Tai Dinh Ngo | 2003-02-18 |
| 5633877 | Programmable built-in self test method and controller for arrays | William V. Huott, Paul R. Turgeon, Robert W. Berry, Jr., Gulsun Yasar, Frederick J. Cox +2 more | 1997-05-27 |
| 5375091 | Method and apparatus for memory dynamic burn-in and test | Robert W. Berry, Jr., Bernd Koenemann, William J. Scarpero, Jr., Kenneth D. Wagner, Gulsun Yasar | 1994-12-20 |