Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7478301 | Partial good integrated circuit and method of testing same | Michael Z. Felske, Pamela S. Gillis, Benjamin P. Lynch, Michael R. Ouellette, Thomas St. Pierre +2 more | 2009-01-13 |
| 7434129 | Partial good integrated circuit and method of testing same | Michael Z. Felske, Pamela S. Gillia, Benjamin P. Lynch, Michael R. Ouellette, Thomas St. Pierre +2 more | 2008-10-07 |
| 7305600 | Partial good integrated circuit and method of testing same | Michael Z. Felske, Pamela S. Gillis, Benjamin P. Lynch, Michael R. Ouellette, Thomas St.Pierre +2 more | 2007-12-04 |
| 7103816 | Method and system for reducing test data volume in the testing of logic products | Frank Distler, Andrew Ferko, Brion Keller, Bernd Koenemann, Donald L. Wheater | 2006-09-05 |