BL

Benjamin P. Lynch

IBM: 3 patents #26,272 of 70,183Top 40%
Overall (All Time): #1,573,522 of 4,157,543Top 40%
3
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
7478301 Partial good integrated circuit and method of testing same Leonard O. Farnsworth, III, Michael Z. Felske, Pamela S. Gillis, Michael R. Ouellette, Thomas St. Pierre +2 more 2009-01-13
7434129 Partial good integrated circuit and method of testing same Leonard O. Farnsworth, III, Michael Z. Felske, Pamela S. Gillia, Michael R. Ouellette, Thomas St. Pierre +2 more 2008-10-07
7305600 Partial good integrated circuit and method of testing same Leonard O. Farnsworth, III, Michael Z. Felske, Pamela S. Gillis, Michael R. Ouellette, Thomas St.Pierre +2 more 2007-12-04