Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
Home › Partial good integrated circuit and method of testing same

Partial good integrated circuit and method of testing same

US Patent 7478301 · Granted Jan 13, 2009

Estimated economic value: $4,505,000 ⓘ

Assignee

Inventors

View full patent text on Google Patents →

More Patents by These Inventors

Hierarchical sort/merge structure using a request pipe2022
Built-in self-test (BIST) engine configured to store a per pattern based fail st2022
Built-in self-test (BIST) engine configured to store a per pattern based fail st2021
Built-in self-test (BIST) engine configured to store a per pattern based fail st2020
Method and system for enumerating digital circuits in a system-on-a-chip (SOC)2020
Method and system for enumerating digital circuits in a system-on-a-chip (SOC)2020
Arbitration for memory diagnostics2020
Built-in self-test (BIST) engine configured to store a per pattern based fail st2020
Integrated circuit chip reliability qualification using a sample-specific expect2020
Memory built-in self-test (MBIST) test time reduction2019
Method and system for enumerating digital circuits in a system-on-a-chip (SOC)2019
Method and system for enumerating digital circuits in a system-on-a-chip (SOC)2019