Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7434129 | Partial good integrated circuit and method of testing same | Leonard O. Farnsworth, III, Michael Z. Felske, Benjamin P. Lynch, Michael R. Ouellette, Thomas St. Pierre +2 more | 2008-10-07 |