Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7305600 | Partial good integrated circuit and method of testing same | Leonard O. Farnsworth, III, Michael Z. Felske, Pamela S. Gillis, Benjamin P. Lynch, Michael R. Ouellette +2 more | 2007-12-04 |
TS
Thomas St.Pierre
Overall (All Time): #3,402,747 of 4,157,543Top 85%
1
Patents All Time