TK

Timothy J. Koprowski

IBM: 17 patents #6,502 of 70,183Top 10%
Overall (All Time): #275,694 of 4,157,543Top 7%
17
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
9715420 String dataflow error detection James R. Cuffney, John G. Rell, Jr., Patrick M. West, Jr. 2017-07-25
9588838 String dataflow error detection James R. Cuffney, John G. Rell, Jr., Patrick M. West, Jr. 2017-03-07
9389955 String dataflow error detection James R. Cuffney, John G. Rell, Jr., Patrick M. West, Jr. 2016-07-12
9292398 Design-based weighting for logic built-in self-test Gregory J. Cook, Mary P. Kusko, Cedric Lichtenau 2016-03-22
9292399 Design-Based weighting for logic built-in self-test Gregory J. Cook, Mary P. Kusko, Cedric Lichtenau 2016-03-22
6968489 Pseudo random optimized built-in self-test Franco Motika 2005-11-22
6816990 VLSI chip test power reduction Peilin Song, Ulrich Baur, Franco Motika 2004-11-09
6708305 Deterministic random LBIST L. Farnsworth, Brion Keller, Bernd Koenemann, Thomas J. Snethen, Donald L. Wheater 2004-03-16
6671838 Method and apparatus for programmable LBIST channel weighting Mary P. Kusko, Lawrence K. Lange, Bryan J. Robbins 2003-12-30
6629280 Method and apparatus for delaying ABIST start William V. Huott, Timothy G. McNamara, Pradip Patel 2003-09-30
6629281 Method and system for at speed diagnostics and bit fail mapping Timothy G. McNamara, William V. Huott 2003-09-30
6442720 Technique to decrease the exposure time of infrared imaging of semiconductor chips for failure analysis Mary P. Kusko, Richard F. Rizzolo, Peilin Song 2002-08-27
6442723 Logic built-in self test selective signature generation Franco Motika, Phillip J. Nigh 2002-08-27
6327685 Logic built-in self test Franco Motika 2001-12-04
6125465 Isolation/removal of faults during LBIST testing Timothy G. McNamara, William V. Huott 2000-09-26
6021514 Limited latch linehold capability for LBIST testing 2000-02-01
5479414 Look ahead pattern generation and simulation including support for parallel fault simulation in LSSD/VLSI logic circuit testing Paul Keller 1995-12-26