Issued Patents All Time
Showing 1–23 of 23 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10998075 | Built-in self-test for bit-write enabled memory arrays | William V. Huott, Daniel Rodko, Matthew Steven Hyde | 2021-05-04 |
| 10971242 | Sequential error capture during memory test | William V. Huott, Daniel Rodko | 2021-04-06 |
| 10890623 | Power saving scannable latch output driver | William V. Huott, Yuen H. Chan, Daniel Rodko | 2021-01-12 |
| 10593420 | Testing content addressable memory and random access memory | Harry Barowski, Sheldon B. Levenstein, Daniel Rodko, Gordon B. Sapp, Rolf Sautter | 2020-03-17 |
| 10170199 | Testing content addressable memory and random access memory | Harry Barowski, Sheldon B. Levenstein, Daniel Rodko, Gordon B. Sapp, Rolf Sautter | 2019-01-01 |
| 10079070 | Testing content addressable memory and random access memory | Harry Barowski, Sheldon B. Levenstein, Daniel Rodko, Gordon B. Sapp, Rolf Sautter | 2018-09-18 |
| 9983261 | Partition-able storage of test results using inactive storage elements | William V. Huott, Thomas J. Knips, Daniel Rodko | 2018-05-29 |
| 9697910 | Multi-match error detection in content addressable memory testing | William V. Huott, Daniel Rodko | 2017-07-04 |
| 9627012 | Shift register with opposite shift data and shift clock directions | William V. Huott, Norman K. James, Daniel Rodko | 2017-04-18 |
| 8361776 | Adaptation of Pitman Moore strain of rabies virus to primary chick embryo fibroblast cell cultures | Pankaj Ramanbhai Patel | 2013-01-29 |
| 8327207 | Memory testing system | Kevin Duffy, William V. Huott, Daniel Rodko | 2012-12-04 |
| 8055960 | Self test apparatus for identifying partially defective memory | William V. Huott, David J. Lund, Kenneth H. Marz, Bryan L. Mechtly | 2011-11-08 |
| 7536613 | BIST address generation architecture for multi-port memories | William V. Huott, Daniel Rodko | 2009-05-19 |
| 7529997 | Method for self-correcting cache using line delete, data logging, and fuse repair correction | Patrick J. Meaney, William V. Huott, Thomas J. Knips, David J. Lund, Bryan L. Mechtly | 2009-05-05 |
| 7478297 | Merged MISR and output register without performance impact for circuits under test | Yuen H. Chan, William V. Huott, Daniel Rodko | 2009-01-13 |
| 7366953 | Self test method and apparatus for identifying partially defective memory | William V. Huott, David J. Lund, Kenneth H. Marz, Bryan L. Mechtly | 2008-04-29 |
| 7305602 | Merged MISR and output register without performance impact for circuits under test | Yuen H. Chan, William V. Huott, Daniel Rodko | 2007-12-04 |
| 7275194 | Clock duty cycle based access timer combined with standard stage clocked output register | William V. Huott, Daniel Rodko | 2007-09-25 |
| 7257745 | Array self repair using built-in self test techniques | William V. Huott, Franco Motika, Daniel Rodko | 2007-08-14 |
| 6629280 | Method and apparatus for delaying ABIST start | Timothy J. Koprowski, William V. Huott, Timothy G. McNamara | 2003-09-30 |
| 5805789 | Programmable computer system element with built-in self test method and apparatus for repair during power-on | William V. Huott, Tin-Chee Lo, Timothy J. Slegel | 1998-09-08 |
| 5659551 | Programmable computer system element with built-in self test method and apparatus for repair during power-on | William V. Huott, Tin-Chee Lo, Timothy J. Slegel | 1997-08-19 |
| 5633877 | Programmable built-in self test method and controller for arrays | Philip G. Shephard, III, William V. Huott, Paul R. Turgeon, Robert W. Berry, Jr., Gulsun Yasar +2 more | 1997-05-27 |