| 10998075 |
Built-in self-test for bit-write enabled memory arrays |
William V. Huott, Daniel Rodko, Matthew Steven Hyde |
2021-05-04 |
| 10971242 |
Sequential error capture during memory test |
William V. Huott, Daniel Rodko |
2021-04-06 |
| 10890623 |
Power saving scannable latch output driver |
William V. Huott, Yuen H. Chan, Daniel Rodko |
2021-01-12 |
| 10593420 |
Testing content addressable memory and random access memory |
Harry Barowski, Sheldon B. Levenstein, Daniel Rodko, Gordon B. Sapp, Rolf Sautter |
2020-03-17 |
| 10170199 |
Testing content addressable memory and random access memory |
Harry Barowski, Sheldon B. Levenstein, Daniel Rodko, Gordon B. Sapp, Rolf Sautter |
2019-01-01 |
| 10079070 |
Testing content addressable memory and random access memory |
Harry Barowski, Sheldon B. Levenstein, Daniel Rodko, Gordon B. Sapp, Rolf Sautter |
2018-09-18 |
| 9983261 |
Partition-able storage of test results using inactive storage elements |
William V. Huott, Thomas J. Knips, Daniel Rodko |
2018-05-29 |
| 9697910 |
Multi-match error detection in content addressable memory testing |
William V. Huott, Daniel Rodko |
2017-07-04 |
| 9627012 |
Shift register with opposite shift data and shift clock directions |
William V. Huott, Norman K. James, Daniel Rodko |
2017-04-18 |
| 8361776 |
Adaptation of Pitman Moore strain of rabies virus to primary chick embryo fibroblast cell cultures |
Pankaj Ramanbhai Patel |
2013-01-29 |
| 8327207 |
Memory testing system |
Kevin Duffy, William V. Huott, Daniel Rodko |
2012-12-04 |
| 8055960 |
Self test apparatus for identifying partially defective memory |
William V. Huott, David J. Lund, Kenneth H. Marz, Bryan L. Mechtly |
2011-11-08 |
| 7536613 |
BIST address generation architecture for multi-port memories |
William V. Huott, Daniel Rodko |
2009-05-19 |
| 7529997 |
Method for self-correcting cache using line delete, data logging, and fuse repair correction |
Patrick J. Meaney, William V. Huott, Thomas J. Knips, David J. Lund, Bryan L. Mechtly |
2009-05-05 |
| 7478297 |
Merged MISR and output register without performance impact for circuits under test |
Yuen H. Chan, William V. Huott, Daniel Rodko |
2009-01-13 |
| 7366953 |
Self test method and apparatus for identifying partially defective memory |
William V. Huott, David J. Lund, Kenneth H. Marz, Bryan L. Mechtly |
2008-04-29 |
| 7305602 |
Merged MISR and output register without performance impact for circuits under test |
Yuen H. Chan, William V. Huott, Daniel Rodko |
2007-12-04 |
| 7275194 |
Clock duty cycle based access timer combined with standard stage clocked output register |
William V. Huott, Daniel Rodko |
2007-09-25 |
| 7257745 |
Array self repair using built-in self test techniques |
William V. Huott, Franco Motika, Daniel Rodko |
2007-08-14 |
| 6629280 |
Method and apparatus for delaying ABIST start |
Timothy J. Koprowski, William V. Huott, Timothy G. McNamara |
2003-09-30 |
| 5805789 |
Programmable computer system element with built-in self test method and apparatus for repair during power-on |
William V. Huott, Tin-Chee Lo, Timothy J. Slegel |
1998-09-08 |
| 5659551 |
Programmable computer system element with built-in self test method and apparatus for repair during power-on |
William V. Huott, Tin-Chee Lo, Timothy J. Slegel |
1997-08-19 |
| 5633877 |
Programmable built-in self test method and controller for arrays |
Philip G. Shephard, III, William V. Huott, Paul R. Turgeon, Robert W. Berry, Jr., Gulsun Yasar +2 more |
1997-05-27 |
