Issued Patents All Time
Showing 25 most recent of 118 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12105834 | User privacy for autonomous vehicles | Mary P. Kusko, Eugene Atwood | 2024-10-01 |
| 11378623 | Diagnostic enhancement for multiple instances of identical structures | Steven M. Douskey, Orazio P. Forlenza, Mary P. Kusko, Gerard M. Salem | 2022-07-05 |
| 11263619 | Secure credit card with near field communications | Edward E. Kelley | 2022-03-01 |
| 11112457 | Dynamic weight selection process for logic built-in self test | Mary P. Kusko, Eugene Atwood | 2021-09-07 |
| 11105853 | Empirical LBIST latch switching and state probability determination | Richard F. Rizzolo, Paul Jacob Logsdon | 2021-08-31 |
| 11079433 | Logic built-in self test dynamic weight selection method | Mary P. Kusko, Eugene Atwood | 2021-08-03 |
| 10930364 | Iterative functional test exerciser reload and execution | Gerard M. Salem, Mary P. Kusko | 2021-02-23 |
| 10768230 | Built-in device testing of integrated circuits | Robert M. Casatuta, Mary P. Kusko, Gary W. Maier, Phong T. Tran | 2020-09-08 |
| 10613142 | Non-destructive recirculation test support for integrated circuits | Mary P. Kusko, Gerard M. Salem | 2020-04-07 |
| 10598526 | Methods and systems for performing test and calibration of integrated sensors | Mitesh Agrawal, Preetham M. Lobo, John D. Parker, Gerard M. Salem, Tobias Webel | 2020-03-24 |
| 10585142 | Functional diagnostics based on dynamic selection of alternate clocking | Mary P. Kusko, Gerard M. Salem | 2020-03-10 |
| 10571519 | Performing system functional test on a chip having partial-good portions | Mitesh Agrawal, Preetham M. Lobo, John D. Parker, Gerard M. Salem | 2020-02-25 |
| 10545188 | Functional diagnostics based on dynamic selection of alternate clocking | Mary P. Kusko, Gerard M. Salem | 2020-01-28 |
| 10365132 | Methods and systems for performing test and calibration of integrated sensors | Mitesh Agrawal, Preetham M. Lobo, John D. Parker, Gerard M. Salem, Tobias Webel | 2019-07-30 |
| 10254336 | Iterative N-detect based logic diagnostic technique | Mary P. Kusko, Gary W. Maier, Phong T. Tran | 2019-04-09 |
| 10247776 | Structurally assisted functional test and diagnostics for integrated circuits | Mary P. Kusko, Gerard M. Salem | 2019-04-02 |
| 10209306 | Methods and systems for generating functional test patterns for manufacture test | John D. Parker, Gerard M. Salem | 2019-02-19 |
| 10203371 | Methods and systems for generating functional test patterns for manufacture test | John D. Parker, Gerard M. Salem | 2019-02-12 |
| 10169510 | Dynamic fault model generation for diagnostics simulation and pattern generation | Mary P. Kusko, Gary W. Maier, Phong T. Tran | 2019-01-01 |
| 10024910 | Iterative N-detect based logic diagnostic technique | Mary P. Kusko, Gary W. Maier, Phong T. Tran | 2018-07-17 |
| 9857422 | Methods and systems for generating functional test patterns for manufacture test | John D. Parker, Gerard M. Salem | 2018-01-02 |
| 9852245 | Dynamic fault model generation for diagnostics simulation and pattern generation | Mary P. Kusko, Gary W. Maier, Phong T. Tran | 2017-12-26 |
| 9588177 | Optimizing generation of test configurations for built-in self-testing | Eugene Atwood, Mary P. Kusko, Paul Jacob Logsdon, Andrew A. Turner | 2017-03-07 |
| 9552449 | Dynamic fault model generation for diagnostics simulation and pattern generation | Mary P. Kusko, Gary W. Maier, Phong T. Tran | 2017-01-24 |
| 9506983 | Chip authentication using scan chains | Dirk Pfeiffer, Peilin Song | 2016-11-29 |