Issued Patents All Time
Showing 1–20 of 20 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12174251 | System testing using partitioned and controlled noise | Mary P. Kusko, William V. Huott, Dustin Feller | 2024-12-24 |
| 12105834 | User privacy for autonomous vehicles | Mary P. Kusko, Franco Motika | 2024-10-01 |
| 11112457 | Dynamic weight selection process for logic built-in self test | Mary P. Kusko, Franco Motika | 2021-09-07 |
| 11079433 | Logic built-in self test dynamic weight selection method | Franco Motika, Mary P. Kusko | 2021-08-03 |
| 11079406 | Semiconductor micro probe array having compliance | — | 2021-08-03 |
| 11041879 | Fluidized alignment of a semiconductor die to a test probe | David M. Audette, Grant Wagner | 2021-06-22 |
| 9588177 | Optimizing generation of test configurations for built-in self-testing | Mary P. Kusko, Paul Jacob Logsdon, Franco Motika, Andrew A. Turner | 2017-03-07 |
| 9335370 | On-chip test for integrated AC coupling capacitors | Matthew B. Baecher, John F. Bulzacchelli, Stanislav Polonsky | 2016-05-10 |
| 9209948 | Testing a decision feedback equalizer (‘DFE’) | Matthew B. Baecher, Minhan Chen, Hayden C. Cranford, Jr., William R. Kelly, Todd M. Rasmus | 2015-12-08 |
| 9041572 | Testing a digital-to-analog converter | Matthew B. Baecher, William R. Kelly, Joseph Franklin Logan, Pinping Sun | 2015-05-26 |
| 9014254 | Testing a decision feedback equalizer (‘DFE’) | Matthew B. Baecher, Minhan Chen, Hayden C. Cranford, Jr., William R. Kelly, Todd M. Rasmus | 2015-04-21 |
| 8405419 | Digital test system and method for value based data | Thomas J. Bardsley, Victor Moy, Michael Won | 2013-03-26 |
| 7218128 | Method and apparatus for locating and testing a chip | — | 2007-05-15 |
| 6656770 | Thermal enhancement approach using solder compositions in the liquid state | Joseph A. Benenati, Giulio DiGiacomo, Horatio Quinones | 2003-12-02 |
| 6281573 | Thermal enhancement approach using solder compositions in the liquid state | Joseph A. Benenati, Giulio DiGiacomo, Horatio Quinones | 2001-08-28 |
| 6212070 | Zero force heat sink | Joseph A. Benenati, James J. Dankelman, Horatio Quinones, Karl J. Puttlitz, Eric J. Kastberg | 2001-04-03 |
| 6147506 | Wafer test fixture using a biasing bladder and methodology | Umar M. Ahmad | 2000-11-14 |
| 5818984 | Optoelectronic interconnection of integrated circuits | Umar M. Ahmad | 1998-10-06 |
| 5805430 | Zero force heat sink | Joseph A. Benenati, James J. Dankelman, Horatio Quinones, Karl J. Puttlitz, Eric J. Kastberg | 1998-09-08 |
| 5790384 | Bare die multiple dies for direct attach | Umar M. Ahmad | 1998-08-04 |